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Repair fuse circuit in a flash memory device

  • US 5,852,580 A
  • Filed: 12/29/1997
  • Issued: 12/22/1998
  • Est. Priority Date: 12/28/1996
  • Status: Expired due to Term
First Claim
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1. A repair fuse circuit in a flash memory device, comprising;

  • a power-on reset circuit to generate first and second control signals in response to a reset pulse which is generated upon power-on;

    a delay circuit to generate third and fourth control signals which are delayed according to said first control signal;

    a gate voltage control circuit to generate a fifth control signal which is delayed according to said third control signal;

    a reference voltage generating circuit to generate a reference voltage in response to said fourth control signal;

    a fuse cell sensing and latching circuit to latch a data stored on a fuse cell in response to said fifth control signal, wherein said fuse cell sensing and latching circuit is initialized by said first and second control signals before the data is latched; and

    an address compare circuit to generate a redundant address by comparing an output of said fuse cell sensing and latching circuit with a normal address.

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