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Apparatus and method for performing electrodynamic focusing on a microchip

  • US 5,858,187 A
  • Filed: 09/26/1996
  • Issued: 01/12/1999
  • Est. Priority Date: 09/26/1996
  • Status: Expired due to Term
First Claim
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1. A method of spatially altering material for determining a property or condition of said material, comprising the steps of:

  • applying a first electric potential to a material transport conduit, said applied first electrical potential inducing axially directed material transport;

    applying a second electric potential to a focusing conduit which forms a confluence with the transport conduit, said applied second electrical potential inducing lateral spatial confinement of the transported material at the confluence; and

    detecting a property or condition of the laterally spatially confined material.

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