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Circuit for testing the operation of a semiconductor device

  • US 5,867,033 A
  • Filed: 05/24/1996
  • Issued: 02/02/1999
  • Est. Priority Date: 05/24/1996
  • Status: Expired due to Term
First Claim
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1. A circuit responsive to a test signal, for testing a semiconductor device, comprising:

  • an input for receiving the test signal,an oscillator formed on the semiconductor device for producing oscillator pulses, when the oscillator is energized, having a frequency corresponding to operational characteristics of the semiconductor device,a control circuit for responding to the test signal from the input and energizing the oscillator for a predetermined length of time,a counter for receiving and counting the oscillator pulses from the oscillator and producing a count corresponding to the number of oscillator pulses received by the counter during the predetermined length of time, andan output circuit for producing an output corresponding to the count indicating at least one of the operational characteristics of the semiconductor device.

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