Method and apparatus for separation of ions in a gas for mass spectrometry

• US 5,869,831 A
• Filed: 06/24/1997
• Issued: 02/09/1999
• Est. Priority Date: 06/27/1996
• Status: Expired due to Term

• Current Assignee: Yale University
• Original Assignee: Yale University
• Inventors: De Juan, Luis, Rosell, Joan, De La Mora, Juan Fernandez, Eichler, Thilo
• Primary Examiner(s): NGUYEN, KIET TUAN
• Application Number:
  US08/881,060
• Time in Patent Office: 595 Days
• Field of Search: 250/288, 250/288 A, 250/281, 250/282
• US Class Current: 250/288
• CPC Class Codes: G01N 15/0266 with electrical classification
• CPC Class Codes: H01J 49/04 Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components

Abstract

An analytical apparatus provides for the separation and analysis of a subset of ions from a mixture of ions in a gas. The apparatus includes an ion supply, such as an electrospray, which provides a population of variously charged ions. An analyzing chamber is coupled to the ion supply and includes a first wall with an inlet orifice for receiving the flow of variously charged ions, and a second wall opposed to the first wall. A laminar gas flow is established within the analyzing chamber along a flow axis. The second wall is provided with an outlet orifice that is displaced by a determined distance along the gas flow axis from the inlet orifice. A potential difference is applied between the first and second walls which causes the flow of ions, introduced via the inlet orifice, to migrate towards the outlet orifice. The laminar gas flow displaces ion flight trajectories along the flow axis, so that only the ions with a mobility near a specific value reach the second wall close enough to the outlet orifice to be sampled through it. The outlet orifice is coupled to the inlet of a mass spectrometer to enable analysis of the ions emerging from the outlet orifice.

Claims

1. Analytical apparatus for separating ions in an ion mixture and for feeding separated ions to an outlet orifice, comprising:

ion supply means for providing a flow of variously charged ions, including a selected species of charged ions to be analyzed;

an analyzing chamber having a gas flow axis and including a first wall with an inlet orifice for receiving said flow of variously charged ions, and a second wall opposed to said first wall by a distance w and having an outlet orifice that is displaced by a determined distance L along said gas flow axis from said inlet orifice;

power supply means for applying a potential between said first wall and second wall which causes said flow of variously charged ions introduced via said inlet orifice to migrate towards said second wall;

means for providing a laminar gas flow within said analyzing chamber and parallel to said flow axis, said gas flow exhibiting a Reynolds number of at least 2000 and displacing flight trajectories of said variously charged ions along said flow axis, said determined distance L set to position said outlet orifice to intercept a trajectory of said selected species of charged ions.

2. The analytical apparatus as recited in claim 1, wherein said means for providing a laminar gas flow comprises:

a flow control chamber having a cross sectional area greater than said analyzing chamber, positioned to provide a gas flow that is coaxial with said flow axis; and

screen means positioned in said flow control chamber to distribute said gas flow throughout said flow control chamber; and

a transition region for coupling said flow control chamber to said analyzing chamber, said transition region providing a laminarization of said gas flow as it enters said analyzing chamber.

3. The analytical apparatus as recited in claim 1, wherein said ion supply means comprises an electrospray apparatus.

4. The analytical apparatus as recited in claim 1, further comprising:

mass spectrometer means coupled to said outlet orifice and wherein said analyzing chamber is operated to provide a substantially continuous ion flow to said mass spectrometer means.

5. The analytical apparatus as recited in claim 1, wherein:

w<

L<

3w.

6. The analytical apparatus as recited in claim 1, wherein said inlet orifice is approximately circular.

7. The analytical apparatus as recited in claim 6, wherein said first wall has a thickness in a vicinity of said inlet orifice that is about one-half a diameter of said inlet orifice.