Fast scanning switch matrix
First Claim
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1. An addressable switch matrix comprising:
- a plurality of switches having first and second terminals across which current may be switched, the first terminals electrically connected in rows and the second terminals electrically connected in columns;
three-state row driving circuits attached to each row for driving the row to one of a scan voltage, a pre-charge voltage different from the scan voltage, or providing a high impedance to the row according to received scan signals;
column input circuits attached to each column which produce a detection signal upon detecting a voltage from the column; and
scanning circuitry providing scan signals to the three-state row driver circuits to selectively drive one row to the scan voltage during a scan period, then to the pre-charge voltage during a succeeding reset time, then to high impedance, the scanning circuitry further receiving the detection signals during the scan period to provide an indication of closed switches, the scanning circuitry further providing the high impedance at row driver circuits not receiving a scan signal during the scan time.
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Abstract
Driving circuitry for a switch matrix provides a reset voltage to all rows of the matrix in between scans to recharge switch capacitance. Column detection circuitry is disabled in between scans so that column driving circuitry may also `reset` the charge on capacitors reducing the scan time and/or allowing a greater number of switch elements, element size, or EMI suppressing capacitances. Pull-up resistors are supplemented or eliminated through the use of active current sourcing and sinking for the drivers.
67 Citations
5 Claims
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1. An addressable switch matrix comprising:
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a plurality of switches having first and second terminals across which current may be switched, the first terminals electrically connected in rows and the second terminals electrically connected in columns; three-state row driving circuits attached to each row for driving the row to one of a scan voltage, a pre-charge voltage different from the scan voltage, or providing a high impedance to the row according to received scan signals; column input circuits attached to each column which produce a detection signal upon detecting a voltage from the column; and scanning circuitry providing scan signals to the three-state row driver circuits to selectively drive one row to the scan voltage during a scan period, then to the pre-charge voltage during a succeeding reset time, then to high impedance, the scanning circuitry further receiving the detection signals during the scan period to provide an indication of closed switches, the scanning circuitry further providing the high impedance at row driver circuits not receiving a scan signal during the scan time. - View Dependent Claims (2, 3, 4, 5)
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Specification