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Method for estimating the service life of a power semiconductor component

  • US 5,877,419 A
  • Filed: 03/04/1997
  • Issued: 03/02/1999
  • Est. Priority Date: 03/14/1996
  • Status: Expired due to Fees
First Claim
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1. A method for estimating the service life of an IGBT, comprising the steps of:

  • subjecting the IGBT to a periodic load change;

    measuring an electrical parameter P of the IGBT that serves as an indicator for reliability or durability against the number N of load changes;

    calculating a derivative dP/dN of the electrical parameter P according to the number N of load changes; and

    comparing the derivative dP/dN with a target value representing a determined service life.

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