Memory cell having negative differential resistance devices
First Claim
1. In a memory system organized as a matrix including a memory cell at each intersection of a bit line with write and read word lines, said memory cell comprising:
- a first field effect transistor (FET) having its gate electrode coupled to a write word line and its drain electrode coupled to a bit line;
a second FET having its source electrode coupled to said bit line and its drain electrode coupled to a read word line; and
first and second negative resistance devices coupled in series between a supply voltage and a substrate voltage, the common point of said series-connected negative resistance devices being coupled to the source electrode of said first FET and to the gate electrode of said second FET.
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Abstract
A memory system is organized as a matrix including a memory cell at each intersection of a bit line with write and read word lines Each memory cell comprises a first FET 20 having its gate coupled to a write word line and its drain coupled to a bit line, a second FET 22 having its source coupled to the bit line and its drain coupled to a read word line, and first and second negative resistance devices 24,26 coupled in series between a supply voltage and a substrate voltage, the common point SN of the series-connected negative resistance devices being coupled to the source of the first PET and to the gate of the second FET. Preferably, the first FET 20 is a p-channel device, the second FET 22 is an n-channel device, and the first and second negative resistance devices 24,26 are RTDs. In a second embodiment, a memory system has a memory cell at each intersection of a bit line with a word line. The memory cell comprises an FET having its gate coupled to a word line and one of its drain and source electrodes coupled to a bit line, first and second negative resistance devices 44,46 coupled in series between a supply voltage and a substrate voltage, the common point SN of the series-connected negative resistance devices being coupled to the other of the drain and source electrodes, and a capacitance 48 coupled between the common point of the series-connected negative resistance devices.
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Citations
4 Claims
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1. In a memory system organized as a matrix including a memory cell at each intersection of a bit line with write and read word lines, said memory cell comprising:
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a first field effect transistor (FET) having its gate electrode coupled to a write word line and its drain electrode coupled to a bit line; a second FET having its source electrode coupled to said bit line and its drain electrode coupled to a read word line; and first and second negative resistance devices coupled in series between a supply voltage and a substrate voltage, the common point of said series-connected negative resistance devices being coupled to the source electrode of said first FET and to the gate electrode of said second FET. - View Dependent Claims (2, 3, 4)
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Specification