×

Method and apparatus for monitoring mineral production

  • US 5,886,255 A
  • Filed: 10/14/1997
  • Issued: 03/23/1999
  • Est. Priority Date: 10/14/1997
  • Status: Expired due to Term
First Claim
Patent Images

1. In combination with a process of mineral production management of a subsurface region embracing a deposit during the life span of the deposit, the deposit having a mineral content, a method for cyclically monitoring time-varying changes of a selected petrophysical parameter having a regional texture attributable to volumetric re-distribution of the content of said deposit due to production of the mineral content thereof from a plurality of boreholes, comprising:

  • a) installing in each of said plurality of boreholes a source of radiation and at least one sensor for measuring a geophysical analogue of said selected petrophysical parameter;

    b) in combination with the process of said mineral production management during a monitoring cycle, causing said source to radiate a wavefield having predefined characteristics to illuminate the subsurface region embracing the deposit, said wavefield being a chirp signal characterized by a predefined length and spectral content;

    c) using said sensor, making a single-ray imaging measurement of said geophysical analogue of the selected petrophysical parameter taken in the light of the wavefield radiation illuminating the subsurface region along a wavefield trajectory between said source and said sensor, the spectral content of the imaged signal being a measure of a characteristic of the selected geophysical parameter;

    d) illuminating said subsurface region from different azimuths by repeating steps b) and c) for every possible source-and-sensor combination from said plurality of boreholes to provide a plurality of single-ray imaging measurements between the respective sources and sensors; and

    e) combining the single-ray imaging measurements to form a snap-shot image representative of the regional texture of the selected petrophysical parameter.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×