Surface acoustic wave device
First Claim
1. A surface acoustic wave device comprising a base including a diamond layer, an Al electrode arranged on said diamond layer at an electrode period, and a ZnO piezoelectric thin film layer formed on said diamond layer with said Al electrode covered with said ZnO piezoelectric thin film layer, wherein:
- said ZnO piezoelectric thin film layer has a thickness h1 within a range defined by 0.65≦
kh1≦
0.75 while said Al electrode has a thickness h2 within a range defined by 0.03≦
kh2≦
0.04, where k is given by k=2π
/λ and
λ
represents the electrode period.
2 Assignments
0 Petitions
Accused Products
Abstract
A surface acoustic wave device comprises a diamond layer (12) or a substrate (11) with a diamond layer (12) formed thereon, an Al electrode (13) formed on the diamond layer (12), and a ZnO piezoelectric thin film layer (14) formed on the diamond layer (12) with the Al electrode (13) covered by the ZnO piezoelectric thin film layer (14). The ZnO piezoelectric thin film layer (14) has a thickness h1 within a range defined by 0.65≦kh1≦0.75 while the Al electrode (13) has a thickness h2 within a range defined by 0.03≦kh2≦0.04, where k is given by k=2 π/λ and λ represents an electrode period.
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Citations
9 Claims
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1. A surface acoustic wave device comprising a base including a diamond layer, an Al electrode arranged on said diamond layer at an electrode period, and a ZnO piezoelectric thin film layer formed on said diamond layer with said Al electrode covered with said ZnO piezoelectric thin film layer, wherein:
said ZnO piezoelectric thin film layer has a thickness h1 within a range defined by 0.65≦
kh1≦
0.75 while said Al electrode has a thickness h2 within a range defined by 0.03≦
kh2≦
0.04, where k is given by k=2π
/λ and
λ
represents the electrode period.- View Dependent Claims (2)
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3. A surface acoustic wave device comprising a base including a diamond layer, an Al electrode formed on said diamond layer, and a ZnO piezoelectric thin film layer formed on said diamond layer with said Al electrode covered with said ZnO piezoelectric thin film layer, wherein:
said ZnO piezoelectric thin film layer has a predetermined thickness while said Al electrode has a thickness within a range such that acoustic reflection at said Al electrode is substantially equal to zero. - View Dependent Claims (4, 5)
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6. A surface acoustic wave device which is for use in propagating a surface wave of a surface wavelength and which has a base, an electrode arranged on said base at an electrode period related to the surface wavelength, and a piezoelectric layer coated on said electrode and said piezoelectric layer, wherein:
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said piezoelectric layer and said electrode have first and second thicknesses both of which are determined in relation to the wavelength of the surface wave such that acoustic reflection at said electrode is substantially equal to zero; and with the electrode period kept substantially equal to the wavelength. - View Dependent Claims (7, 8, 9)
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Specification