Semiconductor integrated circuit device having failure detection circuitry
First Claim
1. A semiconductor integrated circuit device comprising:
- a semiconductor integrated circuit;
a self-test circuit for testing said semiconductor integrated circuit and for providing a failure signal if said semiconductor integrated circuit malfunctions;
a frequency multiplying circuit for receiving a clock signal and for providing to said self-test circuit a reference signal whose frequency is a multiple of the frequency of said clock signal.
1 Assignment
0 Petitions
Accused Products
Abstract
A 12.5-MHz signal is applied from outside a semiconductor integrated circuit (SIC) device to a signal input terminal of that SIC device. A frequency multiplying circuit is fed that 12.5-MHz signal from the input terminal, and delivers a reference signal whose frequency is a multiple of the frequency of the signal received (i.e., 100 MHz), to a semiconductor memory and to a self-test circuit. The self-test circuit provides a test signal in synchronism with that 100-MHz reference signal to the semiconductor memory for testing for the presence or absence of a failure. All elements of the semiconductor memory are tested by the self-test circuit for a failure. If the self-test circuit finds a semiconductor memory element that fails to work properly, it provides a signal indicative of such failure to a failure counting circuit. This failure counting circuit counts the number of times the self-test circuit provides such a signal.
24 Citations
1 Claim
-
1. A semiconductor integrated circuit device comprising:
-
a semiconductor integrated circuit; a self-test circuit for testing said semiconductor integrated circuit and for providing a failure signal if said semiconductor integrated circuit malfunctions; a frequency multiplying circuit for receiving a clock signal and for providing to said self-test circuit a reference signal whose frequency is a multiple of the frequency of said clock signal.
-
Specification
-
- Resources
-
Current AssigneeGodo Kaisha IP Bridge 1 (IP Bridge, Inc.)
-
Original AssigneeMatsushita Electric Industrial Company Limited (Panasonic Holdings Corporation)
-
InventorsHashimoto, Shin, Miyanaga, Isao, Nakata, Yoshiro
-
Primary Examiner(s)Nguyen, Vinh P.
-
Application NumberUS08/744,082Time in Patent Office883 DaysField of Search324/158.1, 324/73.1, 324/754, 324/765, 324/763, 437/8, 371/22.1, 371/22.4, 371/22.5, 371/22.6, 365/200, 365/201, 438/14, 438/17, 438/18, 257/40, 257/48US Class Current324/750.3CPC Class CodesG01R 31/2849 Environmental or reliabilit...G01R 31/2884 using dedicated test connec...
