Scanning near field optical microscope
First Claim
1. A scanning near field optical microscope comprising:
- an optical waveguide probe having a sharpened tip portion provided with a small aperture at the tip portion;
light emitting means for emitting a light to irradiate a sample so that an evanescent light is projected by the sample and scattered by the probe tip, the light emitting means comprising a laser light source, a lens, and a prism;
coarse displacement means for moving one of the optical waveguide probe and the sample to bring the optical waveguide probe close to a surface of the sample;
evanescent light detecting means comprising a lens for collecting the evanescent light projected by the sample and scattered by the probe tip, and a photodetector for detecting the collected evanescent light and producing a corresponding output signal;
means for controlling a distance between the sample and the probe tip comprising a Z axis fine displacement element for moving one of the probe and the sample in response to a control signal, and a Z servo-circuit for receiving the output signal of the photodetector and generating the control signal to control the Z axis fine displacement element so as to control the distance between the probe tip and the sample to maintain the intensity of the detected evanescent light constant;
scanning means for causing relative scanning motion between the probe and the sample in two dimensions, comprising an XY fine displacement element and an XY scanning circuit; and
data processing means for providing an image of a measured characteristic of the sample in three dimensions on the basis of outputs of at least the Z servo-circuit and the XY scanning circuit.
2 Assignments
0 Petitions
Accused Products
Abstract
A high resolution observation apparatus capable of resolving details smaller than the wavelength of a laser beam used for detection includes a probe for scattering evanescent light projected from a sample in response to the incident laser light. The scattered evanescent light is detected by a photodetector located proximate the probe tip. During measurements, the position of the probe is controlled in the Z axis by a fine movement mechanism while being scanned in the XY plane to conduct measurements. The distance between the probe and the sample is maintained constant by use of a Z-axis servo circuit responsive to an output signal of the photodetector for producing a control signal to control the fine movement mechanism to maintain the detected evanescent light constant. A three-dimensional display of an output of the servo circuit is provided.
103 Citations
44 Claims
-
1. A scanning near field optical microscope comprising:
-
an optical waveguide probe having a sharpened tip portion provided with a small aperture at the tip portion; light emitting means for emitting a light to irradiate a sample so that an evanescent light is projected by the sample and scattered by the probe tip, the light emitting means comprising a laser light source, a lens, and a prism; coarse displacement means for moving one of the optical waveguide probe and the sample to bring the optical waveguide probe close to a surface of the sample; evanescent light detecting means comprising a lens for collecting the evanescent light projected by the sample and scattered by the probe tip, and a photodetector for detecting the collected evanescent light and producing a corresponding output signal; means for controlling a distance between the sample and the probe tip comprising a Z axis fine displacement element for moving one of the probe and the sample in response to a control signal, and a Z servo-circuit for receiving the output signal of the photodetector and generating the control signal to control the Z axis fine displacement element so as to control the distance between the probe tip and the sample to maintain the intensity of the detected evanescent light constant; scanning means for causing relative scanning motion between the probe and the sample in two dimensions, comprising an XY fine displacement element and an XY scanning circuit; and data processing means for providing an image of a measured characteristic of the sample in three dimensions on the basis of outputs of at least the Z servo-circuit and the XY scanning circuit. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
-
-
10. A high resolution observation apparatus comprising:
- a light emitting source for emitting an incident light to be incident on a sample so that an evanescent light is projected from the sample in response to the incident light;
a probe disposed proximate a surface of the sample and having a narrow tip for scattering the evanescent light projected by the sample;
an evanescent light detector disposed proximate the probe tip for detecting the evanescent light scattered by the probe tip and outputting a corresponding signal;
a position control system responsive to a control signal for supporting and moving at least one of the probe and the sample in a first direction to control the distance therebetween in the first direction and for causing relative scanning movement therebetween in a plane perpendicular to the first direction; and
a servo circuit responsive to the output signal of the light detector for producing the control signal to control the position control system to maintain the detected evanescent light constant. - View Dependent Claims (11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30)
- a light emitting source for emitting an incident light to be incident on a sample so that an evanescent light is projected from the sample in response to the incident light;
-
31. A high resolution observation apparatus comprising:
-
an optical device having a surface on which a sample to be observed is disposed; an optical source for generating an incident light of a predetermined wavelength to be incident to the sample through the optical device at a total reflection angle; a probe having a sharpened tip for scattering a sample light projected from the sample surface in response to the incident light; an optical detecting system for detecting the sample light scattered by the probe; a position control unit for moving one of the probe and the sample in the XY plane to scan the sample over a two-dimensional area to be observed; and a Z-axis control unit for positioning the probe at a distance from the sample surface in the Z direction close enough to locally scatter sample light projected from a minute region of the sample and for controlling the Z-direction distance between the probe and the sample surface so as to keep a positioning signal detected by the optical detecting system constant during a course of scanning the sample surface over the two-dimensional area to be observed. - View Dependent Claims (32, 33, 34, 35, 36, 37, 38, 39, 40, 41, 42, 43, 44)
-
Specification