Plasma uniformity control for an inductive plasma source
First Claim
1. A method for controlling spatial distribution of ion current flux across a surface of a workpiece undergoing processing in an inductively coupled plasma reactor comprising a reactor enclosure defining a processing chamber, a radio frequency (RF) antenna disposed around and near a portion of the chamber, and a RF power source connected to the antenna for producing an RF induction field within the chamber which in turn determines the ion current flux on the surface of the workpiece, said method comprising the steps of:
- disposing at least one conductive body adjacent to at least one portion of the antenna; and
separating the conductive body from the antenna portion by a prescribed separation distance, said separating step causing an attenuation of a component of the RF induction field produced by said antenna portion to a degree depending on the magnitude of the separation distance.
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Accused Products
Abstract
The present invention reduces those portions of the RF induction field over areas of the wafer experiencing higher etch or deposition rates than those experienced elsewhere on the wafer. Such a controlled reduction of those portions of the RF induction field whose attenuation results in reducing non-uniformity in the etch or deposition rate distribution is obtained by incorporating a plasma uniformity control apparatus into the inductively coupled plasma reactor. The incorporated plasma uniformity control apparatus for controlling the RF induction field produced by the antenna includes one or more conductive bodies which are disposed adjacent to one or more of the radiating elements of the antenna.
54 Citations
27 Claims
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1. A method for controlling spatial distribution of ion current flux across a surface of a workpiece undergoing processing in an inductively coupled plasma reactor comprising a reactor enclosure defining a processing chamber, a radio frequency (RF) antenna disposed around and near a portion of the chamber, and a RF power source connected to the antenna for producing an RF induction field within the chamber which in turn determines the ion current flux on the surface of the workpiece, said method comprising the steps of:
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disposing at least one conductive body adjacent to at least one portion of the antenna; and separating the conductive body from the antenna portion by a prescribed separation distance, said separating step causing an attenuation of a component of the RF induction field produced by said antenna portion to a degree depending on the magnitude of the separation distance. - View Dependent Claims (2, 3, 4, 5, 6)
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7. An inductively coupled plasma reactor for processing a semiconductor wafer disposed therein, the reactor comprising:
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a reactor enclosure defining a processing chamber; a radio frequency (RF) antenna disposed around or near a portion of the chamber; an RF power source connected to the antenna; and a plasma uniformity control apparatus for controlling an RF induction field produced by the antenna within the chamber, the control apparatus comprising; (a) at least one conductive body disposed adjacent to at least one portion of the antenna, (b) placement apparatus for placing said conductive body at a position defining a prescribed separation distance between the body and said one portion of the antenna, wherein the separation distance determines a degree of attenuation the body causes in the RF induction field within the chamber. - View Dependent Claims (8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27)
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Specification