Near-field scanning microwave microscope having a transmission line with an open end

• US 5,900,618 A
• Filed: 08/26/1997
• Issued: 05/04/1999
• Est. Priority Date: 08/26/1997
• Status: Expired due to Fees

• Current Assignee: PNC Bank National Association (The PNC Financial Services Group, Inc.), University of Maryland
• Original Assignee: University of Maryland
• Inventors: Steinhauer, David E., Vlahacos, Kosta, Wellstood, Frederick Charles, Anlage, Steven Mark
• Primary Examiner(s): LE, QUE TAN
• Application Number:
  US08/917,465
• Time in Patent Office: 616 Days
• Field of Search: 250/201.3, 250/234, 250/306-309
• US Class Current: 250/201.3
• CPC Class Codes: B82Y 20/00 Nanooptics, e.g. quantum optics or photonic crystals
• CPC Class Codes: B82Y 35/00 Methods or apparatus for measurement or analysis of nanostructures
• CPC Class Codes: G01Q 60/22 Probes, their manufacture, or their related instrumentation, e.g. holders
• CPC Class Codes: Y10S 977/862 Near-field probe

Abstract

The microscope includes a microwave generator connected to a mismatched transmission line which terminates in a probe with an exposed end. When a sample is brought into close proximity with the exposed end of the probe, the frequencies and quality factors of the standing wave resonances on the transmission line between the source and the probe are modified. The microwave signal reflected from the end of the probe varies as the capacitance between the probe and the sample changes and as the conductivity of the sample changes. Scanning the sample relative to the probe allows generation of an image from the variation of the reflected signal. Alternatively, to image a device with the microscope, a microwave signal is applied to the device, the probe is scanned over the device, and the signal that is picked up is recorded. In a second embodiment, a first lock-in amplifier is used to lock in the microscope at the resonant frequency, and a second lock-in amplifier is used to detect a curvature of the resonance.

Claims

1. A scanning microscope for imaging a sample, the scanning microscope comprising:

generator means for generating electromagnetic energy;

applying means, receiving the electromagnetic energy from the generator means, for applying the electromagnetic energy to the sample to form a field of electromagnetic radiation around the sample;

a probe, for placement in proximity with the sample, for receiving the electromagnetic radiation from the sample, comprising a resonant coaxial transmission line with an open end for receiving the electromagnetic radiation from the probe;

detector means for detecting the electromagnetic radiation received by the probe and for outputting an imaging signal; and

means for analyzing the imaging signal.

2. A scanning microscope as in claim 1, further comprising means for causing relative movement between the sample and the probe.

3. A scanning microscope as in claim 2, wherein the means for causing relative movement comprises:

a table for holding the sample; and

motor means for moving the table, thereby moving the sample.

4. A scanning microscope as in claim 1, wherein the applying means comprises a coupler for receiving the electromagnetic energy generated by the generator means and for applying the electromagnetic energy to the sample through the probe as electromagnetic radiation.

5. A scanning microscope as in claim 4, wherein:

the coupler is a directional coupler; and

the electromagnetic radiation received from the sample by the probe passes through the probe and the directional coupler to the detector means.

6. A scanning microscope as in claim 1, wherein the applying means applies the electromagnetic energy to the sample by means other than the probe.

7. A scanning microscope as in claim 1, wherein:

the scanning microscope operates selectively in a receiving mode and a reflection mode; and

the applying means comprises;

first applying means, comprising a coupler and operating in the reflection mode, for receiving the electromagnetic energy generated by the generator means and for applying the electromagnetic energy to the sample through the probe as electromagnetic radiation; and

second applying means, operating in the receiving mode, for applying the electromagnetic energy to the sample by means other than the probe, and measuring electric or magnetic field with the probe.

8. A scanning microscope as in claim 7, wherein:

the coupler is a directional coupler; and

in the reflection mode, the electromagnetic radiation received from the sample by the probe passes through the probe and the directional coupler to the detector means.

9. A scanning microscope as in claim 1, wherein:

the probe is spaced from the sample to create a resonant circuit having a resonant frequency; and

further comprising feedback means for detecting a shift in the resonant frequency and for controlling the generator means in accordance with the shift in the resonant frequency so that a frequency of the electromagnetic energy generated by the generator means equals the resonant frequency.

10. A scanning microscope as in claim 9, wherein:

the generator means comprises function generator means for generating a waveform with a predetermined frequency; and

the feedback means comprises;

a lock-in amplifier, receiving the signal output by the detector means and the waveform generated by the function generator means, for producing a lock-in output;

an integrator, receiving the lock-in output, for producing an integration signal indicating the shift in the resonant frequency; and

an adder, receiving the integration signal and the waveform generated by the function generator means, for adding the integration signal and the waveform and for outputting a frequency control signal to control generation of the electromagnetic radiation by the generator means.

11. A scanning microscope as in claim 10, wherein the integrator comprises:

a gain switch for selecting a gain of the integrator; and

a reset switch for resetting the integrator.

12. A scanning microscope as in claim 10, wherein the integrator comprises:

a first operational amplifier, having a negative input for receiving the lock-in output and a positive input connected to ground, for integrating the lock-in ouput; and

a second operational amplifier, having a positive input for receiving an output of the first operational amplifier and a negative input connected for feedback from an output of the second operational amplifier, for functioning as a follower.

13. A scanning microscope as recited in claim 12, wherein the adder comprises:

a third operational amplifier, having a negative input for receiving both the output of the second operational amplifier and the waveform and a positive input connected to ground, for outputting an inverted sum of the output of the second operational amplifier and the waveform; and

a fourth operational amplifier, having a negative input for receiving the output from the third operational amplifier and a positive input connected to ground, and a connection between negative input and output for feedback.

14. A scanning microscope as in claim 9, further comprising curvature determining means, receiving the signal output by the detector means, for determining a curvature of a resonant peak of the resonant circuit.

15. A scanning microscope as in claim 14, wherein:

the generator means comprises function generator means for generating a waveform with a predetermined frequency; and

the curvature determining means comprises a lock-in amplifier referenced at twice the predetermined frequency.

16. A scanning microscope as in claim 1, wherein the probe comprises:

an outer conductor; and

an inner conductor having a tip which extends beyond the outer conductor for contacting the sample.

17. A scanning microscope as in claim 16, further comprising spring support means for regulating a contact force between the probe and the sample.