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Method for producing test program for semiconductor device

  • US 5,901,154 A
  • Filed: 06/12/1997
  • Issued: 05/04/1999
  • Est. Priority Date: 06/14/1996
  • Status: Expired due to Fees
First Claim
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1. A method for producing a test program for a semiconductor device comprising the steps of:

  • providing a plurality of test items in an original order, each test item including a plurality of test statements;

    first extracting from each of said plurality of test items a first test statement which is common to each of said plurality of test items; and

    making a test program by sequentially arranging the first test statement and a remainder of non-extracted test statements in a predetermined order.

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