Dual-laser voltage probing of IC's

• US 5,905,577 A
• Filed: 03/15/1997
• Issued: 05/18/1999
• Est. Priority Date: 03/15/1997
• Status: Expired due to Term

• Current Assignee: DCG Systems Incorporated (Thermo Fisher Scientific Incorporated)
• Original Assignee: Schlumberger Technologies Incorporated (SLB)
• Inventors: Rajan, Suresh N., Lo, William K., Wilsher, Kenneth R.
• Primary Examiner(s): KIM, ROBERT H
• Application Number:
  US08/818,345
• Time in Patent Office: 794 Days
• Field of Search: 356/445, 356/448, 324/752
• US Class Current: 356/448
• CPC Class Codes: G01R 31/311 of integrated circuits G01R31/31728 takes precedence

Abstract

A probe beam is used to sample the waveform on an IC device under test (DUT) during each cycle of a test pattern applied to the DUT. A reference laser beam is also used to sample the DUT. For each cycle of the test pattern, the reference and probe beams sample the DUT at the same physical location, but at displaced times with respect to each other. Each reference measurement is made at a fixed time relative to the test pattern while the probe measurements are scanned through the test-pattern time portion of interest, in the manner normal to equivalent time sampling, to reconstruct the waveform. For each test cycle, the ratio of these two measurements is taken. The fluctuations of these ratios due to noise is greatly reduced as compared to fluctuations of the probe measurements taken alone. Thus, a smaller number of averages is required to reconstruct the waveform.

Claims

1. A method of probing an integrated circuit device with laser light to acquire samples of a waveform appearing on the device as the device is exercised by a repetitive pattern of test vectors, comprising:

a. applying a probe-laser pulse 832 to a region of the device at a selected time during each repetition of the pattern of test vectors and detecting energy reflected from the region as the probe-laser pulse is applied, to thereby produce a reflected-light probe sample;

b. applying a reference-laser pulse 842 to said region of the device at a time during each repetition of the pattern of test vectors which is displaced relative to the time at which the probe-laser pulse is applied, and detecting energy reflected from the region as the reference-laser pulse is applied, to thereby produce a reflected-light reference sample;

c. preparing a ratio of the reflected-light probe sample and the reflected-light reference sample for each repetition of the pattern of test vectors to produce a waveform sample having improved signal-to-noise relative to the reflected-light probe sample.

2. The method of claim 1, wherein the selected time of the probe-laser pulse 832 is offset relative to the reference-laser pulse 842 within each repetition of the pattern of test vectors, and wherein a waveform samples are produced at a plurality of selected times within the pattern of test vectors to reconstruct the waveform by equivalent time sampling.

3. The method of claim 1, wherein detecting the energy reflected from said region as the laser-probe pulse is applied and the energy reflected from said region as the reference-laser pulse is applied comprises detecting energy reflected from said region to produce a detector signal, applying the detector signal to a probe-signal integrator 912 during a probe-gate period 844 when the probe-laser pulse is applied to said region, and applying the detector signal to a reference-signal integrator 902 during a reference-gate period 834 when the reference-laser pulse is applied to said region.

4. The method of claim 1, wherein applying the probe-laser pulse 842 to said region comprises generating a train of pulses 606 from a mode-locked laser source 602, selecting the probe-laser pulse from said train of pulses, and applying the selected pulse to said region.

5. The method of claim 4, wherein applying the reference-laser pulse 832 to said region comprises generating a laser beam from a reference source 612, gating the laser beam to produce the reference-laser pulse, and applying the reference-laser pulse to said region.

6. The method of claim 1, wherein detecting energy reflected from said region as the probe-laser pulse is applied comprises producing a detector signal by detecting energy reflected from said region as the probe-laser pulse is applied, producing an integrator signal by integrating the detector signal during a probe-signal gate period 846, producing a sample signal by sampling the integrator signal, and producing the reflected-light probe sample by digitizing the sample signal.

7. The method of claim 1, wherein detecting energy reflected from said region as the reference-laser pulse is applied comprises producing a detector signal (Va) by detecting energy reflected from said region as the reference-laser pulse is applied, producing a reference integrator signal (Vb) by integrating the detector signal during a reference-signal gate period 836, producing a sample signal (Vc) by sampling the reference integrator signal, and producing the reflected-light reference sample by digitizing the sample signal.

8. The method of claim 1, wherein applying the probe-laser pulse 842 to said region comprises adjusting phase relationship of the pattern of test vectors relative to a train of pulses from a mode-locked-laser source, selecting a pulse from said train of pulses, and applying the selected pulse to said region of the device.

9. The method of claim 1, wherein applying the probe-laser pulse 842 to said region comprises:

generating a clock signal, synchronizing operation of a mode-locked-laser source 602 to the clock signal, generating a train of pulses 606 from the mode-locked laser source 602, deriving from the clock signal an adjustable test-vector clock, applying the adjustable test-vector clock to a test-vector generator 682 to produce the pattern of test vectors in a selected phase relationship to the train of pulses 606, selecting the probe-laser pulse from the train of pulses, and applying the selected pulse to said region.

10. The method of claim 1, further comprising the step of compensating for variations in incident power level of the probe-laser pulse and of the reference-laser pulse.

11. The method of claim 10, wherein compensating for variations in incident power level comprises:

detecting incident-energy level of the probe-laser pulse, detecting incident-energy level of the reference-laser pulse, using the detected incident-energy level of the probe-laser pulse to normalize intensity of a probe-laser-pulse source, and using the detected incident-energy level of the reference-laser pulse to normalize intensity of a reference-laser-pulse source.

12. The method of claim 4, wherein selecting the probe-laser pulse from said train of pulses comprises suppressing unwanted pulses from the train of pulses in an optical modulator.

13. The method of claim 12, wherein suppressing the unwanted pulses comprises passing vestigial pulses, further comprising the steps of:

detecting energy of any vestigial pulses v₁ occurring during a reference-gate interval 1204 as a reference-signal offset and using the reference-signal offset to compensate the reflected-light reference sample; and

detecting energy of any vestigial pulses v₂ occurring during a probe-gate interval 1206 as a probe-signal offset and using the probe-signal offset to compensate the reflected-light probe sample.

14. The method of claim 8, wherein selecting a pulse from said train of pulses comprises suppressing unwanted pulses from the train of pulses in an optical modulator.

15. The method of claim 14, wherein suppressing the unwanted pulses comprises passing vestigial pulses, and wherein detecting energy reflected from the region as the reference-laser pulse is applied comprises detecting energy from the region during a time reference-gate interval 834 which includes a selected number of said vestigial pulses.

16. Apparatus for probing an integrated circuit device with laser light to acquire samples of a waveform appearing on the device as the device is exercised by a repetitive pattern of test vectors, comprising:

a. a laser-optical system 604, 630 for applying a probe-laser pulse 832 to a region of the device at a selected time during each repetition of the pattern of test vectors and for applying a reference-laser pulse 842 to said region of the device at a time during each repetition of the pattern of test vectors which is displaced relative to the time at which the probe-laser pulse is applied;

b. a reflected-power detection system 630, 652 for detecting energy reflected from the region as the probe-laser pulse is applied, to thereby produce a reflected-light probe sample, and for detecting energy reflected from the region as the reference-laser pulse is applied, to thereby produce a reflected-light reference sample;

c. a processor for preparing a ratio of the reflected-light probe sample and the reflected-light reference sample for each repetition of the pattern of test vectors to produce a waveform sample having improved signal-to-noise relative to the reflected-light probe sample.

17. The apparatus of claim 16, wherein the selected time of the probe-laser pulse 832 is offset relative to the reference-laser pulse 842 within each repetition of the pattern of test vectors, and wherein a waveform samples are produced at a plurality of selected times within the pattern of test vectors to reconstruct the waveform by equivalent time sampling.

18. The apparatus of claim 16, wherein the reflected-power detection system comprises a reflected-light detector 650 responsive to energy reflected from said region to produce a reflected-light detector signal, a probe-signal integrator 912 for integrating the reflected-light detector signal during a probe-gate period 844 when the probe-laser pulse is applied to said region, and a reference-signal integrator 902 for integrating the reflected-light detector signal during a reference-gate period 834 when the reference-laser pulse is applied to said region.

19. The apparatus of claim 18, wherein the probe-signal integrator 912 produces an integrator signal and wherein the reflected-power detection system further comprises a sample-and-hold circuit 916 for sampling the integrator to produce a sample signal, and an analog-to digital converter 918 for digitizing the sample signal to produce the reflected-light probe sample.

20. The apparatus of claim 16, wherein the laser-optical system comprises a mode-locked-laser source 602 for generating a train of pulses 606, and an optical modulator 608 for selecting the probe-laser pulse from the train of pulses.

21. The apparatus of claim 19, wherein the laser-optical system further comprises a reference source 612 for generating a laser beam 614, and an optical modulator 616 for gating the laser beam to produce the reference-laser pulse.

22. The apparatus of claim 20, wherein the laser-optical system further comprises a beam combiner 620 and optical-transmission elements 624, 626, 628 634, 636 for applying the probe-laser pulse and the reference-laser pulse to said region.

23. The apparatus of claim 16, wherein the reflected-power detection system comprises a detector 650 for detecting energy reflected from said region as the reference-laser pulse is applied to produce a detector signal (Va), an integrator 902 for integrating the detector signal during a reference-signal gate period 836 to produce a reference-integrator signal (Vb), a sample-and-hold circuit 904 for sampling the reference-integrator signal to produce a sample signal (Vc), and an analog-to-digital converter for digitizing the sample signal to produce the reflected-light reference sample.

24. The apparatus of claim 16, wherein the laser-optical system comprises a mode-locked-laser source 602 for producing a train of pulses and an optical modulator 608 responsive to a timing generator 680 for selecting the probe-laser pulse from the train of pulses, and wherein the apparatus further comprises a timing generator 680 for providing a signal MLMod to control the optical modulator and for providing an adjustable clock signal to adjust phase relationship of the pattern of test vectors relative to the train of pulses.

25. The apparatus of claim 24, wherein operation of the mode-locked-laser source is synchronized to a fixed clock signal, and wherein the timing generator 680 comprises an oscillator 702 for generating the fixed clock signal and a variable-frequency source 710 for deriving the adjustable clock signal from the fixed clock signal.

26. The apparatus of claim 16, a incident-power-compensation subsystem 632, 662, 670, 672, 674, 676, 678 for compensating variations in incident power level of the probe-laser pulse and of the reference-laser pulse.

27. The apparatus of claim 26, wherein the incident-power-compensation subsystem comprises a beam splitter 632 for diverting a portion of light from the probe-laser pulse and the reference-laser pulse, an incident-beam detector 670 for detecting energy level of the diverted light to produce an incident-beam detector signal, an integrator 832 for integrating the incident-beam detector signal during a probe-gate period 844, and an integrator 822 for integrating the incident-beam detector signal during a reference-gate period 834.

28. The apparatus of claim 27, wherein the incident-power-compensation subsystem further comprises circuits 824, 828, 834, 838 for sampling and digitizing the integrated incident-beam detector signal to produce incident-power data representing detected incident-energy level of the probe-laser pulse and of the reference-laser pulse.

29. The apparatus of claim 19, wherein the optical modulator 608 selects the probe-laser pulse from said train of pulses by suppressing unwanted pulses from the train of pulses.

30. The apparatus of claim 29, wherein the optical modulator 608 passes vestigial pulses when suppressing unwanted pulses, and wherein the reflected-power detection system detects energy reflected from the region as the reference-laser pulse is applied by detecting energy from the region during a time reference-gate interval 834 which includes a selected number of said vestigial pulses.