Method for making redundant power supplies hot-pluggable

• US 5,909,583 A
• Filed: 01/17/1997
• Issued: 06/01/1999
• Est. Priority Date: 01/17/1997
• Status: Expired due to Term

• Current Assignee: Dell USA LP (Dell Technologies Inc.)
• Original Assignee: Dell USA LP (Dell Technologies Inc.)
• Inventors: Hayes, Stuart W., Schuchmann, Erik A.
• Primary Examiner(s): Sheikh, Ayaz R.
• Assistant Examiner(s): WILEY, DAVID ARMAND
• Application Number:
  US08/785,490
• Time in Patent Office: 865 Days
• Field of Search: 395/750.01-750.08
• US Class Current: 713/300
• CPC Class Codes: G06F 1/263 Arrangements for using multiple switchable power supplies, e.g. battery and AC G06F1/30 takes precedence

Abstract

It has been discovered that providing a computer system with a hot pluggable power supply as well as a disconnectable resistive load allows a second power supply to be brought on-line while operating within the proper voltage range and then disconnecting the resistive load from the power supply so as to conserve energy and lower the operating temperature of the computer system. Such a system also conserves energy by reducing the size of the fan that the computer system requires. Such a system also allows for a the use of larger test resistor thus providing a more accurate load test. Such a system also allows for saving space as one test circuit can be used for both power supplies. Such a system also allows for a reduced capacity power supply as the power supply does not have to continuously supply power to the resistive test load.

Claims

1. A method for supplying power to a computer system comprising:

supplying power to the computer system from a first power supply;

coupling a second power supply to a first resistive load;

testing the second power supply for specified parameters;

selectively supplying power to the computer system from the second power supply as determined by the testing;

decoupling the second power supply from the resistive load after the selectively supplying power.

2. The method of claim 1 wherein the testing further includes:

coupling the second power supply to a test circuit.

3. The method of claim 1 further comprising:

ceasing to supply power to the computer system from the first power supply if the second power supply is supplying power to the computer system.

4. The method of claim 3 further comprising:

removing the first power supply from the computer system.

5. The method of claim 3 further comprising:

coupling the first power supply to a second resistive load;

testing the first power supply for specified parameters;

selectively supplying power to the computer system from the first power supply as determined by the testing;

decoupling the first power supply from the second resistive load.

6. The method of claim 5 wherein the first resistive load and the second resistive load are the same.

7. The method of claim 1 further comprising:

installing the second power supply in the computer system.

8. The method of claim 1 wherein:

the coupling the second power supply to a resistive load includes coupling a first output of the second power supply to the resistive load;

the testing the second power supply includes determining whether the output is at a voltage level within a first specified voltage range, and the selectively supplying power includes supplying power to the computer system if the output of the second power supply tests as at a voltage level within the first specified voltage range.

9. The method of claim 8 wherein the decoupling the second power supply from the resistive load includes decoupling the first output from the resistive load.

10. The method of claim 8 wherein:

the coupling the power supply to a resistive load further includes coupling a second output of the second power supply to a second resistive load;

the testing the second power supply includes determining whether the second output is at a voltage level within a second specified voltage range; and

the selectively supplying power includes supplying power to the computer system if the second output of the second power supply tests as at a voltage level within the second specified voltage range.

11. The method of claim 10 wherein the decoupling the second power supply from the resistive load includes decoupling the second output from the second resistive load.

12. The method of claim 1 further comprising:

installing a third power supply in the computer system;

coupling the third power supply to a second resistive load;

testing the third power supply for specified parameters;

selectively supplying power to the computer system from the third power supply as determined by the testing;

decoupling the third power supply from the second resistive load.

13. The method of claim 12 wherein the first resistive load and the second resistive load are the same resistive load.

14. The method of claim 1 further comprising:

providing a signal indicating that the second power supply is not operating within specified parameters as determined by the testing.

15. The method of claim 1 further comprising:

supplying a current from the second power supply to the first resistive load, where the testing the second power supply includes testing whether the second power supply supplies the current at a voltage level within a specified voltage range.

16. A computer system comprising:

a processor coupled to a power node;

a memory coupled to the processor and to the power node; and

a power supply system, the power supply system including

a first power supply, the first power supply supplying power to the power node;

a second power supply, supplying power to the power node; and

a test and load circuit, the test and load circuit including

a testing circuit, coupled to the second power supply;

a resistive load;

a first switch coupled to the second power supply and to the power node, the first switch selectively coupling the second power supply to the power node as determined by the testing circuit, the first switch coupling the second power supply to the power node while the first power supply supplies power to the computer system; and

a second switch, coupled to the second power supply and the resistive load, the second switch decoupling the second power supply from the resistive load after the second power supply is coupled to supply power to the power node.

17. The computer system of claim 16 wherein the testing circuit tests an output of the second power supply for a voltage, the first switch coupling the second power supply to the power node based on whether the voltage tests within a specified range.

18. The computer system of claim 16 wherein the test and load circuit further includes

a second resistive load;

a second testing circuit;

a third switch coupled to the first power supply and to the power node, the third switch selectively coupling the first power supply to the power node as determined by the testing circuit, the third switch capable of coupling the first power supply to the power node while the second power supply supplies power to the power node

a fourth switch coupled to the first power supply and the second resistive load, the second switch decoupling the first power supply from the second resistive load after the first power supply is coupled to supply power to the power node.

19. The computer system of claim 18 wherein:

the first power supply includes a plurality of outputs capable of supplying power to the computer system, each output supplying power at a different voltage level, and

the power supply system includes a plurality of test and load circuits, each test and load circuit corresponding to a respective voltage level;

each test and load circuit includes a respective fourth switch and a respective second resistive load, each of the respective fourth switches coupling one of the plurality of outputs of the first power supply to one of respective second resistive loads, the respective fourth switches decoupling the plurality of outputs of the first power supply from the respective second resistive loads after the first power supply is coupled to supply power to the power node.

20. The computer system of claim 18 wherein the resistive load and the second resistive load are the same.

21. The computer system of claim 16 further comprising:

a control circuit, coupled to the testing circuit and the first switch, the control circuit responsive to a power ok signal from the testing circuit, the testing circuit generating the power ok signal in response to testing that the second power supply is operating within the specified parameters, the control circuit closing the first switch in response to the power ok signal.

22. The computer system of claim 16 further comprising:

a control circuit, coupled to the second switch, the control circuit opening the second switch after the second power supply is supplying power to the computer system.

23. A computer system comprising:

a processor; and

a power supply system for supplying power to the computer system including the processor, the power supply system capable of receiving power from at least two power supplies, the power supply system including;

a testing circuit;

a test load;

a first switch coupled to a power supply, the first switch selectively coupling the power supply to the computer system to supply power to the computer system as determined by the testing circuit, the first switch coupling the power supply to supply power to the computer system while a second power supply supplies power to the computer system; and

a second switch, coupled to the power supply and the test load, the second switch decoupling the power supply from the test load after the power supply is coupled to supply power to the computer system.

24. The computer system of claim 23 wherein the testing circuit tests an output of the power supply for a voltage, the first switch coupling the power supply to supply power the computer system based on whether the voltage tests within a specified range.

25. The computer system of claim 23 wherein the power supplies convert AC power to DC power to supply DC power to the computer system.

26. The computer system of claim 23 wherein the power supply system further includes:

a third switch coupled to the second power supply, the third switch selectively coupling the second power supply to the computer system to supply power to the computer system as determined by a testing circuit; and

a fourth switch, the fourth switch decoupling the second power supply from a test load after the second power supply is coupled to supply power to the computer system.

27. The computer system of claim 23 further comprising:

a control circuit, coupled to the testing circuit and the first switch, the control circuit responsive to a power ok signal from the testing circuit, the testing circuit generating the power ok signal in response to testing that the power supply is operating within the specified parameters, the control circuit closing the first switch in response to the power ok signal.

28. The computer system of claim 23 further comprising:

a control circuit, coupled to the second switch, the control circuit opening the second switch after the power supply is supplying power to the computer system.

29. A method for bringing on-line a second power supply to supply power while a first power supply is supplying power, the method comprising:

coupling a second power supply to a first test load;

testing the second power supply for specified parameters;

selectively supplying power from the second power supply as determined by the testing;

decoupling the second power supply from the test load after the selectively supplying power.

30. The method of claim 29 wherein the testing further includes:

coupling the second power supply to a test circuit.

31. The method of claim 29 further comprising:

ceasing to supply power from the first power supply if the second power supply is supplying power.

32. The method of claim 31 further comprising:

removing the first power supply.

33. The method of claim 31 further comprising:

coupling the first power supply to a second test load;

testing the first power supply for specified parameters;

selectively supplying power from the first power supply as determined by the testing;

decoupling the first power supply from the second test load.

34. The method of claim 33 wherein the first test load and the second test load are the same.

35. The method of claim 29 further comprising:

installing the second power supply.

36. The method of claim 29 wherein:

the coupling the second power supply to a test load includes coupling a first output of the second power supply to the test load;

the testing the second power supply includes determining whether the output is at a voltage level within a first specified voltage range, and

the selectively supplying power includes supplying power if the output of the second power supply tests as at a voltage level within the first specified voltage range.

37. The method of claim 36 wherein the decoupling the second power supply from the test load includes decoupling the first output from the test load.

38. The method of claim 36 wherein:

the coupling the power supply to a test load further includes coupling a second output of the second power supply to a second test load;

the testing the second power supply includes determining whether the second output is at a voltage level within a second specified voltage range; and

the selectively supplying power includes supplying power if the second output of the second power supply tests as at a voltage level within the second specified voltage range.

39. The method of claim 38 wherein the decoupling the second power supply from the test load includes decoupling the second output from the second test load.

40. The method of claim 29 further comprising:

installing a third power supply;

coupling the third power supply to a second test load;

testing the third power supply for specified parameters;

selectively supplying power from the third power supply as determined by the testing;

decoupling the third power supply from the second test load.

41. The method of claim 40 wherein the first test load and the second test load are the same test load.

42. The method of claim 29 further comprising:

providing a signal indicating that the second power supply is not operating within specified parameters as determined by the testing.

43. The method of claim 29 further comprising:

supplying a current from the second power supply to the first test load, where the testing the second power supply includes testing whether the second power supply supplies the current at a voltage level within a specified voltage range.