Method and apparatus for in-line solder paste inspection
First Claim
Patent Images
1. A method of using a vision system to inspect a material applied in at least one predefined pattern on a portion of a substrate, said method comprising the steps of:
- acquiring a model set of characteristics of said portion of said substrate and said at least one predefined pattern from a model substrate;
acquiring a pre-application set of characteristics of said portion of said substrate before said material is applied on said substrate;
performing a first registration to align said pre-application set of characteristics to said model set of characteristics to form an aligned pre-application set of characteristics;
acquiring a post-application set of characteristics of said portion of said substrate and said at least one predefined pattern after said material is applied on said substrate;
performing a second registration to align said post-application set of characteristics to said aligned pre-application set of characteristics to form an aligned post-application set of characteristics;
processing said aligned pre-application set of characteristics and said aligned post-application set of characteristics to provide an image representative of said material applied in said at least one predefined pattern on said portion of said substrate; and
analyzing said image representative of said material applied on said portion of said substrate to determine information about said material applied in said at least one predefined pattern on said substrate relative to said portion of said substrate.
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Abstract
Inspection of solder paste on a printed circuit board using a before printing image (pre-image) to normalize an after printing image (post-image) of the printed circuit board. Existing lighting and optics used for alignment of the screen printing stencil to the printed circuit board are used for the solder paste inspection. A stencil in the screen printing process is also inspected using a before printing image (pre) to normalize an after printing image (post) of the stencil.
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Citations
33 Claims
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1. A method of using a vision system to inspect a material applied in at least one predefined pattern on a portion of a substrate, said method comprising the steps of:
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acquiring a model set of characteristics of said portion of said substrate and said at least one predefined pattern from a model substrate; acquiring a pre-application set of characteristics of said portion of said substrate before said material is applied on said substrate; performing a first registration to align said pre-application set of characteristics to said model set of characteristics to form an aligned pre-application set of characteristics; acquiring a post-application set of characteristics of said portion of said substrate and said at least one predefined pattern after said material is applied on said substrate; performing a second registration to align said post-application set of characteristics to said aligned pre-application set of characteristics to form an aligned post-application set of characteristics; processing said aligned pre-application set of characteristics and said aligned post-application set of characteristics to provide an image representative of said material applied in said at least one predefined pattern on said portion of said substrate; and analyzing said image representative of said material applied on said portion of said substrate to determine information about said material applied in said at least one predefined pattern on said substrate relative to said portion of said substrate. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26)
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27. A system configured for inspecting a material applied in at least one predefined pattern on a portion of a substrate, said system comprising:
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a camera configured to acquire a model set of characteristics of said portion of said substrate and said at least one predefined pattern from a model substrate, said camera being further configured to acquire a pre-application set of characteristics of said portion of said substrate before said material is applied on said substrate; a processor receiving from said camera said model set of characteristics of said portion of said substrate and said at least one predefined pattern, and said pre-application set of characteristics of said portion of said substrate, said processor performing a first registration to align said pre-application set of characteristics to said model set of characteristics to form an aligned pre-application set of characteristics; and a memory accessible to said processor, receiving therefrom and storing said aligned pre-application set of characteristics, wherein said camera further acquires a post-application set of characteristics of said portion of said substrate and said at least one predefined pattern after said material is applied on said substrate, and said processor performs a second registration to align said post-application set of characteristics to said aligned pre-application set of characteristics to form an aligned post-application set of characteristics and processes said aligned pre-application set of characteristics and said aligned post-application set of characteristics to provide an image representative of said material applied in said at least one predefined pattern on said portion of said substrate. - View Dependent Claims (28, 29, 30, 31, 32, 33)
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Specification