Method of temperature compensation for optoelectronic components, more specifically optoelectronic semiconductors
First Claim
1. A method of temperature compensation for opto-electronic devices, particularly for opto-electronic semiconductor devices, characterized in that said devices are operated under predetermined constant conditions and a first characteristic value is measured which is temperature dependent, and that this characteristic value is compared with a comparison value which has been determined under the same constant conditions but at a different temperature, and that from the relation between this characteristic value and this comparison value a correction function is deduced by which the measurement value detected by the semiconductor device is corrected such that the temperature dependence is compensated for.
2 Assignments
0 Petitions
Accused Products
Abstract
The proposed method of temperature compensation for opto-electronic devices, more specifically opto-electronic semiconductor devices, involves operation of the device under predetermined constant conditions, where a first temperature dependent characteristic value is measured which is then compared with a comparison value determined under identical constant conditions but at a different temperature. A correction function is derived from the relationship between the characteristic value and the comparison value and used to correct the measured value obtained from the semiconductor device so as to compensate for the effect of temperature.
-
Citations
12 Claims
- 1. A method of temperature compensation for opto-electronic devices, particularly for opto-electronic semiconductor devices, characterized in that said devices are operated under predetermined constant conditions and a first characteristic value is measured which is temperature dependent, and that this characteristic value is compared with a comparison value which has been determined under the same constant conditions but at a different temperature, and that from the relation between this characteristic value and this comparison value a correction function is deduced by which the measurement value detected by the semiconductor device is corrected such that the temperature dependence is compensated for.
Specification