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Method of temperature compensation for optoelectronic components, more specifically optoelectronic semiconductors

  • US 5,917,183 A
  • Filed: 05/27/1997
  • Issued: 06/29/1999
  • Est. Priority Date: 09/24/1994
  • Status: Expired due to Term
First Claim
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1. A method of temperature compensation for opto-electronic devices, particularly for opto-electronic semiconductor devices, characterized in that said devices are operated under predetermined constant conditions and a first characteristic value is measured which is temperature dependent, and that this characteristic value is compared with a comparison value which has been determined under the same constant conditions but at a different temperature, and that from the relation between this characteristic value and this comparison value a correction function is deduced by which the measurement value detected by the semiconductor device is corrected such that the temperature dependence is compensated for.

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