Electronic wall-stud sensor with three capacitive elements

• US 5,917,314 A
• Filed: 08/08/1996
• Issued: 06/29/1999
• Est. Priority Date: 08/08/1996
• Status: Expired due to Term

• Current Assignee: Zircon Corporation
• Original Assignee: Zircon Corporation
• Inventors: Heger, Charles E., Dodd, Paul W.
• Primary Examiner(s): Snow, Walter E.
• Application Number:
  US08/694,955
• Time in Patent Office: 1,055 Days
• Field of Search: 324/67, 324/326, 324/658, 324/663, 324/672, 324/679, 324/686
• US Class Current: 324/67
• CPC Class Codes: G01B 7/003 for measuring position, not involving coordinate determination coordinate measuring G01B7/004
• CPC Class Codes: G01D 5/241 by relative movement of capacitor electrodes
• CPC Class Codes: G01V 3/088 operating with electric fields G01V3/082 takes precedence
• CPC Class Codes: G01V 3/15 specially adapted for use during transport, e.g. by a person, vehicle or boat

Abstract

A device for locating the edges of wall studs includes a comparison circuit connected to each of three capacitive elements. As the device is moved along a wall, the comparison circuit monitors the relative charge time associated with each capacitive element, the charge times providing an indication of the relative capacitances of the three capacitive elements. Changes in the relative capacitances of the three elements as the device is moved along a wall are due to a change in the dielectric constant of the wall, which normally results from the presence of a wall stud behind the surface over which the device is moved. The comparison circuit uses differences in the measured relative capacitances of the first, second, and third capacitive elements to locate the edges of the stud.

Claims

1. A method of locating an object positioned behind or within a volume of material, the method comprising:

positioning first, second, and third capacitive elements adjacent first, second, and third regions on a surface of the material wherein the second capacitive element is located between the first and third capacitive elements;

comparing a change of the relative capacitances of the first to that of the second capacitive element, and comparing a change of the relative capacitance of the second to that of the third capacitive element; and

including moving the first, second, and third elements along the surface while comparing the relative capacitances of the first, second, and third capacitive elements.

2. The method of claim 1, wherein the relative capacitances are compared by comparing the relative voltage-change rates of the first, second, and third capacitive elements.

3. The method of claim 2, wherein comparing the relative voltage-change rates includes measuring first, second, and third charge times required for the first, second and third elements to charge to a threshold voltage.

4. The method of claim 1, further comprising a calibration that includes comparing the relative capacitances of the first, second, and third capacitive elements before positioning the first, second, and third capacitive elements adjacent first, second, and third regions on a surface of the material.

5. The method of claim 4, wherein the calibration includes positioning the first, second, and third capacitive elements adjacent a material having a single dielectric constant.

6. The method of claim 5, wherein the material is air.

7. The method of claim 1, further comprising simultaneously exciting the first, second, and third capacitive elements.

11. The method of claim 1, wherein the first, second and third capacitive elements are arranged to be co-planar.

8. A device for locating an object positioned behind or within a volume of material, comprising:

first, second, and third capacitive elements arranged to be co-planar, the second capacitive element being located between the first and third capacitive elements;

a comparison circuit having first, second and third terminals coupled to respectively the first, second and third capacitive elements, wherein the comparison circuit compares a change of the capacitance of the first capacitive element to that of the second capacitive element, and compares a change of the capacitance of the second capacitive element to that of the third capacitive element by moving the first, second, and third elements along the surface while comparing the relative capacitances of the first, second, and third capacitive elements, thereby to determine a location of the object.

9. The device of claim 8, further comprising a single excitation source coupled to each of the first, second and third capacitive elements.

10. The device of claim 8, wherein the device determines a static location of the object.