Substrate tester having shorting pad actuator method and apparatus
First Claim
1. An electrical contacting apparatus having a principal axis, said apparatus comprising:
- an electrical contact pad;
a guide plate having side edges with guide pins extending radially outward from a center of each side edge, wherein said electrical contact pad is mounted and centered upon a top surface of said guide plate;
means for supporting said guide plate to enable a pivotal movement of said guide plate about a point on the principal axis; and
means for providing a contact actuation force to a center of the bottom surface of said guide plate to maintain an equal force across said electrical contact pad in a direction of the principal axis, whereby said electrical contact pad provides a desired contacting force equally balanced across an entire contact area defined by an area of contact between said electrical contact pad and a substrate being contacted.
1 Assignment
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Accused Products
Abstract
An electrical contacting apparatus for testing a substrate (54) and having a principal axis includes an electrical contact pad, a guide plate (106), a supporting bridge (132), and a mechanism for providing a contact actuation force. The guide plate includes side edges with guide pins (108) extending radially outward from a center of each side edge. The electrical contact pad (114) is mounted and centered upon a top surface of the guide plate (106). The support bridge supports the guide plate to enable a pivotal movement of the guide plate about a point on the principal axis. Lastly, the contact actuation force mechanism provides a contact actuation force to a center of the bottom surface of the guide plate to maintain an equal force across the electrical contact pad in a direction of the principal axis, whereby the electrical contact pad provides a desired contacting force equally balanced across an entire contact area defined by an area of contact between the electrical contact pad and a substrate being contacted. The substrate (54) is to be clamped between test probes (52) and the contact pad (114).
31 Citations
16 Claims
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1. An electrical contacting apparatus having a principal axis, said apparatus comprising:
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an electrical contact pad; a guide plate having side edges with guide pins extending radially outward from a center of each side edge, wherein said electrical contact pad is mounted and centered upon a top surface of said guide plate; means for supporting said guide plate to enable a pivotal movement of said guide plate about a point on the principal axis; and means for providing a contact actuation force to a center of the bottom surface of said guide plate to maintain an equal force across said electrical contact pad in a direction of the principal axis, whereby said electrical contact pad provides a desired contacting force equally balanced across an entire contact area defined by an area of contact between said electrical contact pad and a substrate being contacted. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A substrate processing apparatus having an electrical contactor characterized by a principal axis, said apparatus comprising:
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an electrical contact pad; a guide plate having side edges with guide pins extending radially outward from a center of each side edge, wherein said electrical contact pad is mounted and centered upon a top surface of said guide plate; means for supporting said guide plate to enable a pivotal movement of said guide plate about a point on the principal axis; and means for providing a contact actuation force to a center of the bottom surface of said guide plate to maintain an equal force across said electrical contact pad in a direction of the principal axis, whereby said electrical contact pad provides a desired contacting force equally balanced across an entire contact area defined by an area of contact between said electrical contact pad and a substrate being contacted.
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9. An method of electrically contacting a substrate with a contactor having a principal axis, said method comprising the steps of:
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providing an electrical contact pad; providing a guide plate having side edges with guide pins extending radially outward from a center of each side edge, wherein the electrical contact pad is mounted and centered upon a top surface of the guide plate; providing means for supporting the guide plate to enable a pivotal movement of the guide plate about a point on the principal axis; and providing a contact actuation force to a center of the bottom surface of the guide plate to maintain an equal force across the electrical contact pad in a direction of the principal axis, whereby the electrical contact pad provides a desired contacting force equally balanced across an entire contact area defined by an area of contact between the electrical contact pad and the substrate being contacted. - View Dependent Claims (10, 11, 12, 13, 14, 15)
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16. A method of electrically contacting a substrate during a substrate processing operation with a contactor having a principal axis, said method comprising the steps of:
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providing an electrical contact pad; providing a guide plate having side edges with guide pins extending radially outward from a center of each side edge, wherein the electrical contact pad is mounted and centered upon a top surface of the guide plate; providing means for supporting the guide plate to enable a pivotal movement of the guide plate about a point on the principal axis; and providing a contact actuation force to a center of the bottom surface of the guide plate to maintain an equal force across the electrical contact pad in a direction of the principal axis, whereby the electrical contact pad provides a desired contacting force equally balanced across an entire contact area defined by an area of contact between said electrical contact pad and a substrate being contacted.
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Specification