Micromachined rate and acceleration sensor
First Claim
1. In an apparatus for measuring the specific force and angular rotation rate of a moving body, a micromachined structure comprising:
- a) a monolithic substrate having first and second substantially planar surfaces disposed substantially parallel to each other;
b) a first accelerometer formed of said substrate for producing a first output signal indicative of the acceleration applied to the moving body;
c) a second accelerometer formed of said substrate for producing a second output signal indicative of the acceleration applied to the moving body;
d) mounting means formed of said substrate for mounting said first and second accelerometers to move said first and second accelerometers along a vibration axis substantially parallel to said first and second planar surfaces;
e) a link connected between said first and second accelerometers, said link imparting a substantially equal and opposite motion to said one of said first and second accelerometers when the other of said first and second accelerometers is moved; and
f) means for dithering each of said first and second accelerometers along said vibration axis to enable measurement of said specific force and angular rotation rate of said moving body.
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Accused Products
Abstract
A sensor (10) is disclosed for measuring the specific force and angular rotation rate of a moving body and is micromachined from a silicon substrate (16). First and second accelerometers (32a and b) are micromachined from the silicon substrate (16), each having a force sensing axis (38) and producing an output signal of the acceleration of the moving body along its force sensing axis (38). The first and second accelerometers (32a and b) are mounted within the substrate (16) to be moved along a vibration axis (41). The first and second accelerometers (32a and b) are vibrated or dithered to increase the Coriolis component of the output signals from the first and second accelerometers (32a and b). A sinusoidal drive signal of a predetermined frequency is applied to a conductive path (92) disposed on each of the accelerometers. Further, magnetic flux is directed to cross each of the conductive paths (92), whereby the interaction of the magnetic flux and of the drive signal passing therethrough causes the desired dithering motion. A link (72) is formed within the silicon substrate (16) and connected to each of the accelerometers (32a and b), whereby motion imparted to one results in a like, but opposite motion applied to the other accelerometer (32). Further, a unitary magnet (20) and its associated flux path assembly direct and focus the magnetic flux through the first and second accelerometers (32a and b) formed within the silicon substrate (16).
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Citations
4 Claims
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1. In an apparatus for measuring the specific force and angular rotation rate of a moving body, a micromachined structure comprising:
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a) a monolithic substrate having first and second substantially planar surfaces disposed substantially parallel to each other; b) a first accelerometer formed of said substrate for producing a first output signal indicative of the acceleration applied to the moving body; c) a second accelerometer formed of said substrate for producing a second output signal indicative of the acceleration applied to the moving body; d) mounting means formed of said substrate for mounting said first and second accelerometers to move said first and second accelerometers along a vibration axis substantially parallel to said first and second planar surfaces; e) a link connected between said first and second accelerometers, said link imparting a substantially equal and opposite motion to said one of said first and second accelerometers when the other of said first and second accelerometers is moved; and f) means for dithering each of said first and second accelerometers along said vibration axis to enable measurement of said specific force and angular rotation rate of said moving body. - View Dependent Claims (2, 3, 4)
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Specification