Electrostatic discharge event locators

• US 5,923,160 A
• Filed: 04/19/1997
• Issued: 07/13/1999
• Est. Priority Date: 04/19/1997
• Status: Expired due to Term

• Current Assignee: Lucent Technologies, Inc. (Nokia Corporation)
• Original Assignee: Lucent Technologies, Inc. (Nokia Corporation)
• Inventors: Jon, Min-Chung, Lin, Don L., DeChiaro, Louis F.
• Primary Examiner(s): Regan, Maura
• Application Number:
  US08/845,122
• Time in Patent Office: 815 Days
• Field of Search: 324/72, 324/72.5, 324/452, 324/456, 324/457, 361/112, 361/113, 361/91
• US Class Current: 324/72.5
• CPC Class Codes: G01R 29/0814 Field measurements related to measuring influence on or from apparatus, components or humans EMC, EMI and similar testing in general G01R31/001, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
• CPC Class Codes: G01R 29/0892 Details related to signal analysis or treatment; presenting results, e.g. displays; measuring specific signal features other than field strength, e.g. polarisation, field modes, phase, envelope, maximum value

Abstract

Determining the location of an ESD event is achieved through the use of an envelope detector or absolute value comparator which identifies the arrival of an electromagnetic waveform generated by an ESD event at each of a plurality of antennas. Arrival times are compared to determine the location of the ESD event. A plurality of N antennas are employed, and each antenna is coupled to a corresponding envelope detector, threshold discriminator, switch, and register. The output of a clock is coupled to the switches, and a microprocessor is coupled to the registers. When an antenna receives a waveform corresponding to ESD, the envelope detector extracts an envelope signal related to the envelope of the waveform and couples the envelope signal to the threshold discriminator. When the envelope signal has a value above a specified threshold, the threshold discriminator sends a signal to latch the current count of the clock into the corresponding register. When each register is loaded with an arrival time, the microprocessor applies a triangulation procedure to the arrival times to calculate the location of the ESD event.

Claims

1. A system for determining the location of an ESD event comprising:

(a) a plurality of antennas, and

(b) a device for measuring and comparing the arrival times of an electromagnetic waveform generated by the ESD event at each of the plurality of antennas to determine a location for the ESD event.

2. The system of claim 1 wherein the device for measuring and comparing comprises a plurality of envelope detectors, and each of respective antennas is coupled to a corresponding envelope detector.

3. The system of claim 1 wherein the device for measuring and comparing comprises a microprocessor.

4. The system of claim 1 wherein the device for measuring and comparing comprises a plurality of envelope detectors coupled to a microprocessor, such that each of respective antennas is coupled to a corresponding envelope detector.

5. The system of claim 1 wherein the device for measuring and comparing comprises an analog-to-digital converter.

6. The system of claim 5 wherein the device for measuring and comparing further comprises a microprocessor coupled to the analog-to-digital converter.

7. The system of claim 2 wherein the device for measuring and comparing further comprises a plurality of threshold discriminators, each of respective threshold discriminators coupled to a corresponding envelope detector for receiving an envelope waveform from the envelope detector, each threshold discriminator generating an indication signal in response to a waveform envelope at least a portion of which has a magnitude above, or equal to or above, a specified threshold.

8. The system of claim 1 wherein the device for measuring and comparing further comprises an analog-to-digital converter and a threshold detector responsive to digitized electromagnetic waveforms having instantaneous values at or above, or above, a specified threshold.