Inspection method
First Claim
1. A method of processing a reflected image including a pattern of reflected image elements representing a pattern of illuminated generally spherical reflective elements on an article, said method comprising the steps of:
- locating said pattern of reflected image elements in said reflected image;
dividing at least one reflected image element into a plurality of pixels, each pixel having a gray scale value corresponding to an intensity level of reflected light in said reflected image element;
positioning vectors across said at least one reflected image element;
examining a series of pixels along each of said vectors to locate at least four points around said at least one reflected image element;
fitting a circle around each of said at least four points located on said at least one reflected image element, wherein said circle corresponds to a known percentage of a true diameter of said generally spherical reflective element; and
determining inspection information pertaining to said at least one illuminated generally spherical reflective element represented by said at least one reflected image element using dimensions of said circle fit around each of said at least four points located on said at least one reflected image element.
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Accused Products
Abstract
An inspection system and method uses a ring illumination apparatus to illuminate one or more reflective elements, such as solder balls on an electronic component or other protruding surfaces or objects. The ring illumination apparatus includes a substantially ring-shaped light source that provides a substantially even illumination across the one or more reflective elements. An illumination detection device detects light beams reflecting off of the illuminated reflective elements for forming a reflected image. A method of processing the reflected image includes locating one or more points on each reflected image element representing an illuminated reflective element. The points on the reflected image elements are used to located the pattern of the reflected image elements and/or to fit an outline around each image element corresponding to a known percentage of the true dimensions of each solder ball or other reflective element. The inspection system and method thereby determines various characteristics such as the absence/presence, location, pitch, size and shape of each reflective element.
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Citations
19 Claims
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1. A method of processing a reflected image including a pattern of reflected image elements representing a pattern of illuminated generally spherical reflective elements on an article, said method comprising the steps of:
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locating said pattern of reflected image elements in said reflected image; dividing at least one reflected image element into a plurality of pixels, each pixel having a gray scale value corresponding to an intensity level of reflected light in said reflected image element; positioning vectors across said at least one reflected image element; examining a series of pixels along each of said vectors to locate at least four points around said at least one reflected image element; fitting a circle around each of said at least four points located on said at least one reflected image element, wherein said circle corresponds to a known percentage of a true diameter of said generally spherical reflective element; and determining inspection information pertaining to said at least one illuminated generally spherical reflective element represented by said at least one reflected image element using dimensions of said circle fit around each of said at least four points located on said at least one reflected image element. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. A method of processing a reflected image including a pattern of reflected image elements representing a pattern of illuminated reflective elements on an article, said method comprising the steps of:
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locating said pattern of reflected image elements in said reflected image; locating at least one point on at least one reflected image element in said pattern of reflected image elements, wherein the step of locating said at least one point on said at least one reflected image element includes; dividing said at least one reflected image element into a plurality of pixels, each pixel having a gray scale value corresponding to an intensity level of reflected light in said at least one reflected image element; positioning at least one vector across said at least one reflected image element; examining a series of pixels along said at least one vector; determining an intensity gradient at each pixel in said series of pixels along said at least one vector positioned across said at least one reflected image element; and responsive to said step of determining an intensity gradient, locating a point of maximum intensity gradient along said at least one vector positioned across said at least one reflected image element, wherein each said point of maximum intensity gradient corresponds to an outside edge of said at least one reflected image element; and determining inspection information pertaining to at least one illuminated reflective element represented by said at least one reflected image element using said at least one point located on said at least one reflected image element. - View Dependent Claims (13, 14, 15)
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16. A method of processing a reflected image including a pattern of reflected image elements representing a pattern of illuminated, generally spherical reflective elements on an article, said method comprising the steps of:
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locating said pattern of reflected image elements in said reflected image; locating at least one point on at least one reflected image element in said pattern of reflected image elements, wherein the step of locating said at least one point on said at least one reflected image element includes; dividing said at least one reflected image element into a plurality of pixels, each pixel having a gray scale value corresponding to an intensity level of reflected light in said reflected image element; positioning at least one vector across said at least one reflected image element; examining a series of pixels along said at least one vector; locating a pixel of maximum gray scale value along said at least one vector positioned across said at least one reflected image element, wherein said pixel of maximum gray scale value corresponds to a brightest midpoint of said at least one reflected image element and corresponds to a known location on at least one illuminated generally spherical reflective element represented by said at least one reflected image element; and determining inspection information pertaining to said at least one illuminated generally spherical reflective element represented by said at least one reflected image element using said at least one point located on said at least one reflected image element. - View Dependent Claims (17, 18, 19)
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Specification