Side scatter tomography system

• US 5,930,326 A
• Filed: 07/08/1997
• Issued: 07/27/1999
• Est. Priority Date: 07/12/1996
• Status: Expired due to Term

• Current Assignee: American Science and Engineering Incorporated (OSI Systems Incorporated)
• Original Assignee: American Science and Engineering Incorporated (OSI Systems Incorporated)
• Inventors: Grodzins, Lee, Rothschild, Peter
• Primary Examiner(s): Porta, David P.
• Application Number:
  US08/890,957
• Time in Patent Office: 749 Days
• Field of Search: 378/57, 378/51, 378/86, 378/87, 378/88, 378/89, 378/90, 378/62, 378/6
• US Class Current: 378/57
• CPC Class Codes: G01N 23/04 and forming images of the material
• CPC Class Codes: G01V 5/222 measuring scattered radiation
• CPC Class Codes: G01V 5/224 Multiple energy techniques using one type of radiation, e.g. X-rays of different energies
• CPC Class Codes: G01V 5/226 using tomography

Abstract

An x-ray tomography system measures x-rays side-scattered by material concealed within an enveloping surface. One or more x-ray beams are incident on the enveloping surface and scattered onto collimated detectors disposed in arrays parallel to the incident x-ray beams. By varying the relative orientation of the enveloping surface with respect to the x-ray beams and measuring the x-rays side-scattered by the material concealed within the enveloping surface, the shape, density, position and composition of the contents of the enveloping surface may be mapped.

Claims

1. A tomography system for analyzing a material concealed within an enveloping surface, the system comprising:

a. a first source of penetrating radiation for emitting a beam along a beam axis disposed with an orientation with respect to the material and a second beam of penetrating radiation counterpropagating to the first beam;

b. at least one array of segmented detectors disposed along a detector axis substantially parallel to the beam axis for detecting scattered radiation and producing signals corresponding at least to the scattered radiation; and

c. a scanner arrangement for varying the orientation of the beam axis with respect to the material.

2. The tomography system in accordance with claim 1, wherein the counterpropagating beams are alternatingly illuminated.

3. The tomography system in accordance with claim 1, further comprising a plurality of collimators disposed in directions perpendicular to the beam axis for limiting the field of view of each segmented detector.

4. A method for analyzing material concealed within an enveloping surface, the method comprising:

a. illuminating the enveloping surface with penetrating radiation;

b. measuring a flux of penetrating radiation side-scattered into a detector by a plurality of voxels of the concealed material; and

c. creating a three-dimensional map of the flux of penetrating radiation scattered by the plurality of voxels of the concealed material.

5. The method according to claim 4, further including:

d. correcting the map of the flux of scattered penetrating radiation for attenuation in material disposed between the concealed material and the detector.

6. The method according to claim 4, further including:

d. correcting the map of the flux of scattered penetrating radiation for a geometrical disposition of the concealed material with respect to the detector.

7. The method according to claim 4, further including:

d. determining a dimension of the concealed material on the basis of a dimension of a region of enhanced scatter.

8. The method according to claim 4, further including:

d. measuring an attenuation of penetrating radiation by the concealed material on the basis of penetrating radiation transmitted through the enveloping surface.

9. The method according to claim 8, further including:

e. determining a dimension of the concealed material on the basis of a dimension of a region of enhanced scatter.

10. The method according to claim 9, further including:

f. determining a density of the concealed material based on the attenuation of penetrating radiation by the concealed material and the dimension of the concealed material.

23. The method for analyzing concealed material within an enveloping surface, as set forth in claim 10, further comprising the step of categorizing a degree of threat constituted by said material.

11. A method for analyzing material having edges, the material concealed within an enveloping surface, the method comprising:

a. illuminating the enveloping surface with penetrating radiation propagating substantially along a beam axis;

b. measuring a profile of penetrating radiation side-scattered by the concealed material to a single side of the concealed material; and

c. locating the edges of the material on the basis of the profile of penetrating radiation side-scattered by the concealed material to the single side of the concealed material.

12. The method according to claim 11, further comprising the step of determining the dimensions of the concealed material along the beam axis.

13. The method according to claim 11, further including measuring penetrating radiation transmitted through the material.

14. The method according to claim 13, further including calculating an attenuation of penetrating radiation attributable to the material.

15. The method according to claim 13, further including deriving an attenuation per unit length characteristic of the material.

16. The method according to claim 11, further comprising the step of calculating the density of the concealed material on the basis of the attenuation and dimensions of the material.

17. The method according to claim 11, further comprising the step of raster-scanning the beam axis in a plane transverse to the beam axis.

18. The method according to claim 11, further including determining the three-dimensional shape of the concealed material on the basis of edges with respect to a plurality of beam positions.

19. The method according to claim 11, further comprising the step of imaging the concealed material.

20. The method according to claim 15, further comprising:

a. comparing the attenuation of penetrating radiation per unit length in the concealed material with tabulated values; and

b. determining the composition of the concealed material.

21. The method according to claim 20, further comprising:

a. comparing the density of the concealed material with tabulated values; and

b. determining the composition of the concealed material.

22. The method according to claim 14, further comprising the step of locating the material in the attenuation-thickness plane for determining a composition of the concealed material.

24. The method for analyzing concealed material within an enveloping surface, as set forth in claim 11, further comprising the step of conveying the enveloping surface in a direction perpendicular to the beam axis.

25. The method according to claim 11, wherein the step of determining the edges of the concealed material includes the step of detecting a peak in the side-scattered radiation.

26. The method according to claim 11, wherein the step of illuminating the enveloping surface with penetrating radiation propagating substantially along an axis includes the step of alternating between illumination by two counterpropagating beams.

27. The method according to claim 17, further comprising deriving an attenuation of scattered radiation in a direction transverse to the beam axis.

28. The method according to claim 27, further comprising:

a. measuring an attenuation of the illuminating penetrating radiation; and

b. deriving an atomic number of the concealed material on the basis of at least the ratio of the attenuation of the illuminating penetrating radiation to the attenuation of the scattered radiation.

29. The method according to claim 17, further comprising correcting a calculated scatter per unit volume for matter intervening between the concealed material and the detector array.

30. The method according to claim 29, further comprising

a. calculating a spread in attenuation of illuminating penetrating radiation across a specified volume of the enveloping surface;

b. identifying types of objects concealed within the enveloping surface on the basis of the spread in measured attenuation over a specified volume of the enveloping surface.

31. The method according to claim 30, further comprising the step of comparing calculated scatter per unit volume against an expected scatter per unit volume based on the identified type of object concealed within the enveloping surface.

32. The method according to claim 11, wherein the step of illuminating the enveloping surface with penetrating radiation includes illuminating the enveloping surface alternatingly with differing energy distributions and determining an effective atomic number corresponding to the concealed material on the basis of the ratio of penetrating radiation transmitted through the material at a first and a second energy distribution.

33. The method according to claim 11, wherein the step of locating the edges of the material includes detecting discontinuities in the profile of side-scattered penetrating radiation.