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Capacitor and method employing improved dielectric outside plates

  • US 5,933,317 A
  • Filed: 09/30/1997
  • Issued: 08/03/1999
  • Est. Priority Date: 05/15/1995
  • Status: Expired due to Fees
First Claim
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1. A housed capacitor comprising:

  • (a) a plate array comprising a plurality of plates in proximity to one another,said plates being substantially flat and conductive,said plates having a surface, a first edge or edges, and a second edge or edges,at least two of said plates being outermost plates,each of said outermost plates having an outermost surface,said plate array having a plurality of sides,(b) a first dielectric located inside said plate array,each oppositely facing pair of said plates being separated from each other by an instance of said first dielectric,the instances of said first dielectric having an average thickness T,said first dielectric comprising a first material,said first material being substantially solid at 1 degree celsius,(c) a second dielectric located outside said plate array,said second dielectric comprising a second material,an instance of said second dielectric being disposed proximate to each side of said plate array,(d) and connecting means suitable for making external electrical connection in plural polarities to said plurality of plates,said plurality of plates being electrically connected in said plural polarities to said connecting means,said connecting means being connected to said plates at said first edge or edges,at least a portion of said connecting means for each of said plural polarities being located outside said plate array,(e) said second dielectric comprising a first portion, a second portion, and a third portion,said outermost surface of each of said outermost plates being covered by said first portion,said first portion being disposed proximate to and substantially parallel to each said outermost surface,said first portion having a thickness measured substantially perpendicular to said surface of said plates,said second portion being disposed proximate to said first edge or edges,said second portion being substantially perpendicular to said first portion,said second portion having a thickness measured in a direction substantially parallel to said surface of said plates,said third portion being disposed proximate to said second edge or edges,said third portion covering at least some portion of said second edge or edges, of at least one of said plates connected in each of said plural polarities,said third portion being substantially perpendicular to said first portion and substantially perpendicular to said second portion,said third portion having a thickness measured in a direction substantially parallel to said surface of said plates,said third portion comprising a material that, at 1 degree celsius, is selected from the group consisting of a substantially solid material and a liquid material,(f) the improvement comprising at least one instance of said second dielectric having a form selected from the group of;

    (i) comprising entirely an uncontained gas, and (ii) comprising a solid with a thickness less than the numerical product 6RT,wherein said T represents said average thickness of said first dielectric,wherein said R is a numerical ratio selected from the group consisting of;

    the ratio of dielectric constant for said first material to dielectric constant for said second material, and the ratio of dielectric absorption for said first material to dielectric absorption for said second material, and the ratio of dissipation factor for said first material to dissipation factor for said second material, and the ratio of molecular dipole moment for said first material to molecular dipole moment for said second material, and the ratio of propagation velocity for an electromagnetic wave in said second material to propagation velocity for an electromagnetic wave in said first material, and the ratio of observable degradation of a signal processed by a test conductor placed adjacent to a given dimensioned test sample of said first material to observable degradation of a signal processed by a test conductor placed adjacent to a given same dimensioned test sample of said second material.

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