Capacitor and method employing improved dielectric outside plates
First Claim
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1. A housed capacitor comprising:
- (a) a plate array comprising a plurality of plates in proximity to one another,said plates being substantially flat and conductive,said plates having a surface, a first edge or edges, and a second edge or edges,at least two of said plates being outermost plates,each of said outermost plates having an outermost surface,said plate array having a plurality of sides,(b) a first dielectric located inside said plate array,each oppositely facing pair of said plates being separated from each other by an instance of said first dielectric,the instances of said first dielectric having an average thickness T,said first dielectric comprising a first material,said first material being substantially solid at 1 degree celsius,(c) a second dielectric located outside said plate array,said second dielectric comprising a second material,an instance of said second dielectric being disposed proximate to each side of said plate array,(d) and connecting means suitable for making external electrical connection in plural polarities to said plurality of plates,said plurality of plates being electrically connected in said plural polarities to said connecting means,said connecting means being connected to said plates at said first edge or edges,at least a portion of said connecting means for each of said plural polarities being located outside said plate array,(e) said second dielectric comprising a first portion, a second portion, and a third portion,said outermost surface of each of said outermost plates being covered by said first portion,said first portion being disposed proximate to and substantially parallel to each said outermost surface,said first portion having a thickness measured substantially perpendicular to said surface of said plates,said second portion being disposed proximate to said first edge or edges,said second portion being substantially perpendicular to said first portion,said second portion having a thickness measured in a direction substantially parallel to said surface of said plates,said third portion being disposed proximate to said second edge or edges,said third portion covering at least some portion of said second edge or edges, of at least one of said plates connected in each of said plural polarities,said third portion being substantially perpendicular to said first portion and substantially perpendicular to said second portion,said third portion having a thickness measured in a direction substantially parallel to said surface of said plates,said third portion comprising a material that, at 1 degree celsius, is selected from the group consisting of a substantially solid material and a liquid material,(f) the improvement comprising at least one instance of said second dielectric having a form selected from the group of;
(i) comprising entirely an uncontained gas, and (ii) comprising a solid with a thickness less than the numerical product 6RT,wherein said T represents said average thickness of said first dielectric,wherein said R is a numerical ratio selected from the group consisting of;
the ratio of dielectric constant for said first material to dielectric constant for said second material, and the ratio of dielectric absorption for said first material to dielectric absorption for said second material, and the ratio of dissipation factor for said first material to dissipation factor for said second material, and the ratio of molecular dipole moment for said first material to molecular dipole moment for said second material, and the ratio of propagation velocity for an electromagnetic wave in said second material to propagation velocity for an electromagnetic wave in said first material, and the ratio of observable degradation of a signal processed by a test conductor placed adjacent to a given dimensioned test sample of said first material to observable degradation of a signal processed by a test conductor placed adjacent to a given same dimensioned test sample of said second material.
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Abstract
A finished capacitor product and method in which the outer dielectric, protecting or encapsulating the basic inner capacitor structure, is improved in dielectric quality, relative to prior art and relative to the inner dielectric between plates. This improved outer dielectric has been experimentally demonstrated to provide improved electrical performance, including better signal handling performance, for the capacitor. This finding is contrary to prior art, which has attached great significance to the quality of the inner dielectric between capacitor plates, but has not attached great significance to the quality of the dielectric outside the capacitor plates.
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Citations
15 Claims
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1. A housed capacitor comprising:
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(a) a plate array comprising a plurality of plates in proximity to one another, said plates being substantially flat and conductive, said plates having a surface, a first edge or edges, and a second edge or edges, at least two of said plates being outermost plates, each of said outermost plates having an outermost surface, said plate array having a plurality of sides, (b) a first dielectric located inside said plate array, each oppositely facing pair of said plates being separated from each other by an instance of said first dielectric, the instances of said first dielectric having an average thickness T, said first dielectric comprising a first material, said first material being substantially solid at 1 degree celsius, (c) a second dielectric located outside said plate array, said second dielectric comprising a second material, an instance of said second dielectric being disposed proximate to each side of said plate array, (d) and connecting means suitable for making external electrical connection in plural polarities to said plurality of plates, said plurality of plates being electrically connected in said plural polarities to said connecting means, said connecting means being connected to said plates at said first edge or edges, at least a portion of said connecting means for each of said plural polarities being located outside said plate array, (e) said second dielectric comprising a first portion, a second portion, and a third portion, said outermost surface of each of said outermost plates being covered by said first portion, said first portion being disposed proximate to and substantially parallel to each said outermost surface, said first portion having a thickness measured substantially perpendicular to said surface of said plates, said second portion being disposed proximate to said first edge or edges, said second portion being substantially perpendicular to said first portion, said second portion having a thickness measured in a direction substantially parallel to said surface of said plates, said third portion being disposed proximate to said second edge or edges, said third portion covering at least some portion of said second edge or edges, of at least one of said plates connected in each of said plural polarities, said third portion being substantially perpendicular to said first portion and substantially perpendicular to said second portion, said third portion having a thickness measured in a direction substantially parallel to said surface of said plates, said third portion comprising a material that, at 1 degree celsius, is selected from the group consisting of a substantially solid material and a liquid material, (f) the improvement comprising at least one instance of said second dielectric having a form selected from the group of;
(i) comprising entirely an uncontained gas, and (ii) comprising a solid with a thickness less than the numerical product 6RT,wherein said T represents said average thickness of said first dielectric, wherein said R is a numerical ratio selected from the group consisting of; the ratio of dielectric constant for said first material to dielectric constant for said second material, and the ratio of dielectric absorption for said first material to dielectric absorption for said second material, and the ratio of dissipation factor for said first material to dissipation factor for said second material, and the ratio of molecular dipole moment for said first material to molecular dipole moment for said second material, and the ratio of propagation velocity for an electromagnetic wave in said second material to propagation velocity for an electromagnetic wave in said first material, and the ratio of observable degradation of a signal processed by a test conductor placed adjacent to a given dimensioned test sample of said first material to observable degradation of a signal processed by a test conductor placed adjacent to a given same dimensioned test sample of said second material. - View Dependent Claims (2, 3, 4, 5)
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6. A housed capacitor comprising:
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(a) a plate array comprising a plurality of plates in proximity to one another, said plates being conductive and rolled up or convolutely wound, said plates having a surface, a first edge or edges, and a second edge or edges, at least one of said plates being an outermost plate, each said outermost plate having an outermost surface, said plate array having a plurality of sides, (b) a first dielectric located inside said plate array, each oppositely facing pair of said plates being separated from each other by an instance of said first dielectric, the instances of said first dielectric having an average thickness T, said first dielectric comprising a first material, said first material being substantially solid at 1 degree celsius, (c) a second dielectric located outside said plate array, said second dielectric comprising a second material, an instance of said second dielectric being disposed proximate to each side of said plate array, (d) and connecting means suitable for making external electrical connection in plural polarities to said plurality of plates, said plurality of plates being electrically connected in said plural polarities to said connecting means, said connecting means being connected to said plates at said first edge or edges, at least a portion of said connecting means for each of said plural polarities being located outside said plate array, (e) said second dielectric comprising a first portion and a second portion, said first portion being disposed proximate to and substantially parallel to each said outermost surface, said first portion having a thickness measured substantially perpendicular to said surface of said plates, said first portion covering said outermost surface of each said outermost plate, said first portion extending more than one complete turn around said outermost surface of said outermost plate, in the direction that said outermost plate is rolled or convolutely wound, in the case where said first portion comprises a material that is substantially solid at 1 degree celsius, said second portion being disposed proximate to said first edge or edges, said second portion being substantially perpendicular to said first portion, said second portion having a thickness measured in a direction substantially parallel to said surface of said plates, (f) the improvement comprising at least one instance of said second dielectric having a form selected from the group of;
(i) comprising entirely an uncontained gas, and (ii) comprising a solid with a thickness less than the numerical product 6RT,wherein said T represents said average thickness of said first dielectric, wherein said R is a numerical ratio selected from the group consisting of; the ratio of dielectric constant for said first material to dielectric constant for said second material, and the ratio of dielectric absorption for said first material to dielectric absorption for said second material, and the ratio of dissipation factor for said first material to dissipation factor for said second material, and the ratio of molecular dipole moment for said first material to molecular dipole moment for said second material, and the ratio of propagation velocity for an electromagnetic wave in said second material to propagation velocity for an electromagnetic wave in said first material, and the ratio of observable degradation of a signal processed by a test conductor placed adjacent to a given dimensioned test sample of said first material to observable degradation of a signal processed by a test conductor placed adjacent to a given same dimensioned test sample of said second material. - View Dependent Claims (7, 8, 9, 10)
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11. A method for housing a capacitor,
said capacitor comprising: -
(a) a plate array comprising a plurality of plates in proximity to one another, said plates having a surface, a first edge or edges, and a second edge or edges, at least one of said plates being an outermost plate, each said outermost plate having an outermost surface, said plate array having a plurality of sides, (b) a first dielectric located inside said plate array, each oppositely facing pair of said plates being separated from each other by an instance of said first dielectric, the instances of said first dielectric having an average thickness T, said first dielectric comprising a first material, said first material being substantially solid at 1 degree celsius, (c) and connecting means suitable for making external electrical connection in plural polarities to said plurality of plates, said plurality of plates being electrically connected in said plural polarities to said connecting means, said connecting means being connected to said plates at said first edge or edges, at least a portion of said connecting means for each of said plural polarities being located outside said plate array, (d) said method comprising the step of providing a second dielectric located outside said plate array, said second dielectric comprising a second material, an instance of said second dielectric being disposed proximate to each side of said plate array, said second dielectric comprising a first portion and a second portion, and the step of providing that said first portion be disposed proximate to and substantially parallel to each said outermost surface, said first portion having a thickness measured substantially perpendicular to said surface of said plates, said first portion covering said outermost surface of each said outermost plate, said first portion extending more than one complete turn around said outermost surface of said outermost plate, in the direction that said outermost plate is rolled or convolutely wound, in the case where said capacitor is a roll capacitor or a convolutely wound capacitor and in the case where said first portion comprises a material that is substantially solid at 1 degree celsius, and the step of providing that said second portion be disposed proximate to said first edge or edges, said second portion being substantially perpendicular to said first portion, said second portion having a thickness measured in a direction substantially parallel to said surface of said plates, and the step of providing a third portion of said second dielectric in the case where said plurality of plates comprise flat plates, said third portion being disposed proximate to said second edge or edges, said third portion covering at least some portion of said second edge or edges, of at least one of said plates connected in each of said plural polarities, said third portion being substantially perpendicular to said first portion and substantially perpendicular to said second portion, said third portion having a thickness measured in a direction substantially parallel to said surface of said plates, said third portion comprising a material that, at 1 degree celsius, is selected from the group consisting of a substantially solid material and a liquid material, (e) and the step of providing that at least one instance of said second dielectric has a form selected from the group of;
(i) comprising entirely an uncontained gas, and (ii) comprising a solid with a thickness less than the numerical product 6RT,wherein said T represents said average thickness of said first dielectric, wherein said R is a numerical ratio selected from the group consisting of; the ratio of dielectric constant for said first material to dielectric constant for said second material, and the ratio of dielectric absorption for said first material to dielectric absorption for said second material, and the ratio of dissipation factor for said first material to dissipation factor for said second material, and the ratio of molecular dipole moment for said first material to molecular dipole moment for said second material, and the ratio of propagation velocity for an electromagnetic wave in said second material to propagation velocity for an electromagnetic wave in said first material, and the ratio of observable degradation of a signal processed by a test conductor placed adjacent to a given dimensioned test sample of said first material to observable degradation of a signal processed by a test conductor placed adjacent to a given same dimensioned test sample of said second material. - View Dependent Claims (12, 13, 14, 15)
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Specification