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Noninvasive optical method for measuring internal switching and other dynamic parameters of CMOS circuits

  • US 5,940,545 A
  • Filed: 07/18/1996
  • Issued: 08/17/1999
  • Est. Priority Date: 07/18/1996
  • Status: Expired due to Term
First Claim
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1. A method for measuring the internal timing of integrated circuits comprising:

  • a. obtaining periodic optical emissions from an integrated circuit operating with time-varying internal currents, andb. time resolving said emissions by photon timing to provide information about said integrated circuit.

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