Method and circuit for providing accurate voltage sensing for a power transistor, or the like

• US 5,942,910 A
• Filed: 08/28/1997
• Issued: 08/24/1999
• Est. Priority Date: 08/28/1997
• Status: Expired due to Term

• Current Assignee: Texas Instruments, Inc.
• Original Assignee: Texas Instruments, Inc.
• Inventors: Nguyen, Baoson
• Primary Examiner(s): Ballato, Josie
• Assistant Examiner(s): SUNDARAM, T R
• Application Number:
  US08/919,453
• Time in Patent Office: 726 Days
• Field of Search: 324/769, 324/765, 324/766, 324/767, 324/768, 324/763, 438/18, 438/268, 257/48
• US Class Current: 324/762.08
• CPC Class Codes: G01R 31/2621 for testing field effect transistors, i.e. FET's

Abstract

A circuit (10) is disclosed for enabling voltage to be sensed across a power transistor (12) of the type which has first and second active regions, such as source (85) and drain (76) regions of an MOS transistor (12), or emitter and collector regions of a bipolar transistor (42), in a semiconductor substrate (72), with the first region (76) located along a first lateral extent in the substrate (72) to have ends at terminal locations (D1,S1) of the first lateral extent and the second region located along a second lateral extent in the substrate (72) to have ends at terminal locations (D2,S2) of the second lateral extent. The circuit (10) includes a first conductive line (20) connected to the first region at said terminal locations (D1,D2) of the first lateral extent, and a first voltage sensing connection (22) to a midpoint of the first conductive line (20). A second conductive line (28) is connected to the second region at the terminal locations (S1,S2) of the second lateral extent, and a second voltage sensing connection is made to a midpoint (34) of the second conductive line (28). The conductive lines (20,28) may be, for example, metal, polysilicon, or other suitable material.

Claims

1. A circuit for enabling voltage to be sensed across a power transistor having first and second active regions in a semiconductor substrate, said first active region being located along a first lateral extent in said substrate to have ends at terminal locations of said first lateral extent and said second active region being located along a second lateral extent in said substrate to have drain ends at terminal locations of said second lateral extent, comprising:

a first conductive line connected to said first active region at said terminal locations of said first lateral extent;

a first voltage sensing connection at a midpoint of said first conductive line;

a second conductive line connected to said second active region at said terminal locations of said second lateral extent;

a second voltage sensing connection at a midpoint of said second conductive line.

2. The circuit of claim 1 wherein said first and second conductive lines are metal lines.

3. The circuit of claim 2 wherein said first and second conductive lines are located on a surface of said substrate.

4. The circuit of claim 1 wherein said first and second conductive lines extend adjacent said respective first and second active regions.

5. The circuit of claim 1 wherein said first and second active regions are respectively source and drain regions of an MOS transistor.

6. The circuit of claim 1 wherein said first and second active regions are respectively emitter and collector regions of a bipolar transistor.

8. The circuit of claim 5 wherein said first and second conductive lines are metal lines.

9. The circuit of claim 6 wherein said first and second conductive lines are located on a surface of said substrate.

10. The circuit of claim 5 wherein said first and second conductive lines extend adjacent said respective first and second active regions.

11. The circuit of claim 5 wherein said first and second active regions are respectively source and drain regions of an MOS transistor.

12. The circuit of claim 5 wherein said first and second active regions are respectively emitter and collector regions of a bipolar transistor.

14. The method of claim 9 wherein said steps of providing first and second conductive lines comprises providing first and metal lines.

15. The method of claim 10 wherein said steps of providing first and second conductive lines comprises locating said first and second conductive lines on a surface of said substrate.

16. The method of claim 9 wherein said step of providing first and second conductive lines comprises establishing said first and second conductive lines at locations adjacent respective ones of said first and second active regions.

17. The method of claim 9 wherein said step of providing a first conductive line connected to said first active region at said terminal locations of said first lateral extent comprises connecting a conductive line to a source region of an MOS power transistor, and wherein said step of providing a second conductive line connected to said second active region at said terminal locations of said second lateral extent comprises connecting a conductive line to a drain region of said MOS power transistor.

18. The method of claim 9 wherein said step of providing a first conductive line connected to said first active region at said terminal locations of said first lateral extent comprises connecting a conductive line to an emitter region of a bipolar power transistor, and wherein said step of providing a second conductive line connected to said second active region at said terminal locations of said second lateral extent comprises connecting a conductive line connected to a collector region of said bipolar power transistor.

7. A circuit for sensing a voltage across a power transistor having a first and second active regions in a semiconductor substrate, said first active region being located along a first lateral extent in said substrate to have ends at terminal locations of said first lateral extent and said second active region being located along a second lateral extent in said substrate to have drain ends at terminal locations of said second lateral extent, comprising:

a first conductive line connected to said first active region at said terminal locations of said first lateral extent;

a second conductive line connected to said second active region at said terminal locations of said second lateral extent;

a voltage sensing circuit connected between respective midpoints of said first and second conductive lines.

13. A method for sensing voltage across a power transistor having first and second active regions in a semiconductor substrate, said first active region being located along a first lateral extent in said substrate to have ends at terminal locations of said first lateral extent and said second active region being located along a second lateral extent in said substrate to have ends at terminal locations of said second lateral extent, comprising:

providing a first conductive line connected to said first active region at said terminal locations of said first lateral extent;

providing a second conductive line connected to said second active region at said terminal locations of said second lateral extent;

sensing a voltage between a midpoint of said first conductive line and a midpoint of said second conductive line.