System, method, and computer program product for digital cross connect testing
First Claim
1. A computer testing system for testing at least one digital cross connect device (DXC), comprising:
- a DXC test tool; and
at least one test and monitor unit (TMU), said DXC test tool being coupled to each DXC and to each TMU;
wherein;
said DXC test tool sends a logical command for placing said at least one DXC in a known state;
said at least one TMU tests the physical presence of said known state in said at least one DXC and sends a response to said DXC test tool indicating whether said known state is present;
whereby, said DXC test tool can test each DXC in physical and logical dimensions.
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Accused Products
Abstract
A computer testing system, method, and computer program product is provided for testing one or more digital cross connect devices (DXCs) with one or more test and monitoring units (TMUs). A DXC test tool is coupled to each DXC and to each TMU. The DXC test tool sends a logical command or query to a DXC. A TMU tests the physical presence of the logical command directed to the DXC. The TMU sends a response to the DXC test tool indicating the state of the physical component. In this way, the DXC test tool tests each DXC in physical and logical dimensions. The DXC test tool can communicate over a plurality of communication links including fast channel links, human readable links, and remote control links. Routers are used to expand capacity. A single message display option for selecting between sending ASCII messages and sending binary messages. By connecting the DXC test tool to multiple DXCs, end-to-end path testing in physical and logical dimensions is performed. The DXC test tool also generates an analysis log of unexpected DXC and TMU responses. The analysis log and communication log are comprised of records having data fields so that a user can filter the logs. Timestamps further aid analysis. A scripting language is used that significantly reduces the number of lines required for a script. The scripting language uses repeatable commands and pointers that point to data tables. Multiple DXCs can be tested in parallel by running multiple scripts at the same time. The user-interface allows for interactive and dynamic script execution.
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Citations
24 Claims
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1. A computer testing system for testing at least one digital cross connect device (DXC), comprising:
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a DXC test tool; and at least one test and monitor unit (TMU), said DXC test tool being coupled to each DXC and to each TMU;
wherein;said DXC test tool sends a logical command for placing said at least one DXC in a known state; said at least one TMU tests the physical presence of said known state in said at least one DXC and sends a response to said DXC test tool indicating whether said known state is present;
whereby, said DXC test tool can test each DXC in physical and logical dimensions. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22)
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23. A computer-implemented testing method for testing at least one digital cross connect device (DXC), using a DXC test tool and a test and monitor unit (TMU), comprising:
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sending a logical command from the DXC test tool for placing at least one DXC in a known state; testing the physical presence of said known state in the at least one DXC; and sending a response to the DXC test tool indicating whether said known state is present;
whereby, the DXC test tool can test each DXC in physical and logical dimensions.
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24. A computer program product comprising a computer useable medium having computer program logic recorded thereon for enabling a processor in a computer system to test at least one digital cross connect device (DXC) with at least one test and monitor unit (TMU), said computer program logic comprising:
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means for enabling the processor to send a logical command for placing at least one DXC in a known state; and means for enabling the processor to receive a response from the at least one TMU indicating whether said at least one DXC is physically in said known state, whereby, the processor can test each DXC in physical and logical dimensions.
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Specification