Programmable integrated circuit having test antifuse circuitry for testing programming conductors

• US 5,955,892 A
• Filed: 09/17/1997
• Issued: 09/21/1999
• Est. Priority Date: 06/21/1996
• Status: Expired due to Term

• Current Assignee: James M. Apland
• Original Assignee: James M. Apland
• Inventors: Apland, James M.
• Primary Examiner(s): Santamauro, Jon
• Assistant Examiner(s): LE, DON P
• Application Number:
  US08/931,898
• Time in Patent Office: 734 Days
• Field of Search: 326/38-41
• US Class Current: 326/41
• CPC Class Codes: H03K 17/223 in field-effect transistor switches
• CPC Class Codes: H03K 19/17736 Structural details of routing resources
• CPC Class Codes: H03K 19/17764 for reliability
• CPC Class Codes: H03K 19/1778 Structural details for adapting physical parameters
• CPC Class Codes: H03K 19/17796 for physical disposition of blocks

Abstract

In a programmable integrated circuit such as a field programmable gate array (see FIG. 6), a programming driver is coupled to one end of a programming conductor and a test transistor/test antifuse structure is coupled to the other end of the programming driver. To test the continuity of the programming conductor, the test transistor is controlled to be conductive. If the programming driver can drive an adequately large amount of programming current through the length of the programming conductor to the conductive test transistor and the test antifuse such that the test antifuse programs, then it is determined that the programming conductor has adequate continuity. In some embodiments a second test transistor that should be permanently nonconductive is disposed in parallel with the test antifuse.

Claims

1. A programmable integrated circuit, comprising:

a plurality of linearly extending wire segments, the wire segments being substantially collinearly disposed with respect to one another in a first dimension;

a plurality of antifuses, a respective one of the antifuses being disposed between each respective pair of adjacent wire segments;

a programming driver;

a test transistor;

a programming control conductor extending in the first dimension;

a plurality of programming transistors, each respective one of the programming transistors having a first electrode coupled to a corresponding respective one of the wire segments and a gate electrode coupled to the programming control conductor;

a programming conductor extending in a second dimension perpendicular to the first dimension from the programming driver, to a second electrode of one of the programming transistors, and terminating at the test transistor;

a first test conductor extending in the first dimension and being coupled to a gate electrode of test transistor;

a second test conductor extending in the first dimension; and

a test antifuse disposed electrically in series with the test transistor such that when the test transistor is conductive and the test antifuse is programmed, a conductive path exists through the test transistor, through the programmed test antifuse, and to the second test conductor.

2. The programmable integrated circuit of claim 1, wherein the programming driver is disposed adjacent a side D of the programmable integrated circuit, and wherein the second test conductor extends in the first dimension adjacent another side E of the programmable integrated circuit opposite side D.

3. The programmable integrated circuit of claim 1, wherein the test transistor is smaller than the programming transistors.

4. The programmable integrated circuit of claim 1, further comprising:

a second test transistor disposed electrically in parallel with the test antifuse such that a first electrode of the second test transistor is coupled to one electrode of the test antifuse and such that a second electrode of the second test transistor is coupled to a second electrode of the test antifuse, the second test transistor having a gate electrode that is coupled to ground potential such that the second test transistor is permanently nonconductive.

5. The programmable integrated circuit of claim 1, the programmable integrated circuit being a field programmable gate array, each of the plurality of antifuses comprising amorphous silicon.

6. The programmable integrated circuit of claim 1, further comprising:

a plurality of linearly extending second wire segments, the second wire segments being substantially collinearly disposed with respect to one another in the first dimension;

a plurality of second antifuses, a respective one of the second antifuses being disposed between each respective pair of adjacent second wire segments;

a second programming control conductor extending in the first dimension; and

a plurality of second programming transistors, each respective one of the second programming transistors having a first electrode coupled to a corresponding respective one of the second wire segments and a gate electrode coupled to the second programming control conductor, the programming conductor being coupled to a second electrode of one of the second programming transistors.

7. The programmable integrated circuit of claim 6, wherein the programming control conductor and the second programming control conductor extend parallel to each other in the first dimension.