Apparatus for measuring bulk materials and surface conditions for flat and curved parts

• US 5,966,011 A
• Filed: 07/27/1998
• Issued: 10/12/1999
• Est. Priority Date: 08/25/1995
• Status: Expired due to Term

• Current Assignee: Jentek Sensors, Inc.
• Original Assignee: Jentek Sensors, Inc.
• Inventors: Eckhardt, Homer D., Goldfine, Neil J., Clark, David C.
• Primary Examiner(s): STRECKER, GERARD R
• Application Number:
  US09/122,980
• Time in Patent Office: 442 Days
• Field of Search: 324/207.17-207.19, 324/207.26, 324/209, 324/229-233, 324/239-243, 336/200, 336/206, 336/223, 336/232, 340/870.31, 340/870.32, 340/870.35, 340/870.36
• US Class Current: 324/242
• CPC Class Codes: G01B 7/16 for measuring the deformation in a solid, e.g. by resistance strain gauge
• CPC Class Codes: G01B 7/34 for measuring roughness or irregularity of surfaces
• CPC Class Codes: G01N 27/82 for investigating the presence of flaws

Abstract

A meandering winding magnetometer (MWM) includes a meandering primary winding and at least one sensing winding or coil on a membrane to be pressed against a test surface. The membrane may be supported on a flexible carrier which is translatable into a probe. Abutments in the probe press the carrier against the test surface but allow the carrier and membrane to conform to the test surface. One MWM circuit includes meandering primary and secondary windings. The return leads from the secondary winding return to connector pads in close alignment with the test array, while leads from the primary winding are spaced at least one wavelength from the array. In another MWM circuit, individual sensing loops are positioned within the meandering primary winding. The MWM circuit may be provided on an adhesive tape which may be cut to length.

Claims

1. A test circuit comprising:

a meandering primary winding for imposing a spatially periodic magnetic field in a test substrate, the winding having extended portions across a sensing region and connecting portions connecting adjacent extended portions;

at least one meandering sensing winding having an extended length parallel to the extended portions of the primary winding;

terminal leads providing a pair of connections to each of the primary and sensing windings, leads from the at least one sensing winding being closely parallel at a terminal end and one of the first and second leads including a return length which closely parallels an outer extended length of the sensing winding; and

a substrate for carrying the meandering primary winding, the meandering sensing winding, and the terminal leads.

2. A test circuit as claimed in claim 1 wherein the return length is spaced less than one quarter wavelength from the outer extended length of the sensing winding.

3. A test circuit as claimed in claim 1 comprising first and second meandering sensing windings on opposite sides of the primary winding, terminal leads from each sensing winding being closely parallel at a terminal end and including a return length which closely parallels outer extended length of the sensing winding.

4. A test circuit as claimed in claim 3 wherein pairs of terminal leads to the respective sensing windings are positioned substantially the same distance to either side of a terminal lead to the primary winding.

5. A test circuit as claimed in claim 4 wherein first and second terminal leads to the primary winding are substantially displaced from the terminal leads of the sensing winding.

6. A test circuit as claimed in claim 5 wherein the terminal leads of the primary windings are spaced at least one wavelength from the terminal leads of the sensing windings and the terminal leads to each sensing winding are spaced less than one quarter wavelength from each other.

7. A test circuit as claimed in claim 5 further comprising shielding over the connecting portions and terminal leads of the test circuit.

8. A test circuit as claimed in claim 1 wherein first and second terminal leads to the primary winding are substantially displaced from the terminal leads of the sensing winding.

9. A test circuit as claimed in claim 8 wherein the terminal leads to the primary winding are displaced at least one wavelength from terminal leads to the sensing winding.

10. A test circuit as claimed in claim 1 further comprising shielding over the connecting portions and terminal leads of the test circuit.

11. A test circuit as claimed in claim 1 wherein the outer portions of the sensing winding include a first extended length of the sensing winding and connecting portions of the sensing winding.

12. A test circuit as claimed in claim 1 comprising first and second meandering sensing windings on opposite sides of the primary winding, terminal leads to each sensing winding including a return length which closely parallel a first extended length of the winding and connecting portions of the sensing winding.