Programming architecture for a programmable integrated circuit employing test antifuses and test transistors

• US 5,966,028 A
• Filed: 09/17/1997
• Issued: 10/12/1999
• Est. Priority Date: 06/21/1996
• Status: Expired due to Term

• Current Assignee: QuickLogic Corporation
• Original Assignee: QuickLogic Corporation
• Inventors: Apland, James M.
• Primary Examiner(s): Santamauro, Jon
• Assistant Examiner(s): LE, DON P
• Application Number:
  US08/929,654
• Time in Patent Office: 755 Days
• Field of Search: 326/38-41
• US Class Current: 326/41
• CPC Class Codes: H03K 17/223 in field-effect transistor switches
• CPC Class Codes: H03K 19/17736 Structural details of routing resources
• CPC Class Codes: H03K 19/17764 for reliability
• CPC Class Codes: H03K 19/1778 Structural details for adapting physical parameters
• CPC Class Codes: H03K 19/17796 for physical disposition of blocks

Abstract

A programmable integrated circuit (see FIG. 5) has a plurality of linearly extending wire segments with antifuses disposed between each wire segment and a plurality of linearly extending programming conductors that are perpendicular to the wire segments. A plurality of programming transistors are disposed between a corresponding respective one of the wire segments and a corresponding respective one of the programming conductors. A programming control conductor extending from a programming control driver is coupled to the gate electrode of each of the programming transistors as well as the gate electrode of a test transistor. A test antifuse is coupled in series with the test transistor. When the programming control conductor can drive the test transistor with an adequately high voltage to program the test antifuse, it is assumed that the programming control conductor can drive the programming transistor with an adequately high voltage to program the antifuses. The test transistor may be disposed on the programming control conductor at the opposite end from the programming control driver.

Claims

1. A programmable integrated circuit, comprising:

a plurality of linearly extending wire segments, the wire segments being substantially collinearly disposed with respect to one another in a first dimension;

a plurality of antifuses, a respective one of the antifuses being disposed between each respective pair of adjacent wire segments;

a plurality of programming conductors extending parallel to one another in a second dimension perpendicular to the first dimension;

a plurality of programming transistors, each respective one of the programming transistors having a first electrode coupled to a corresponding respective one of the wire segments and having a second electrode coupled to a corresponding respective one of the programming conductors;

a programming control driver;

a test transistor;

a programming control line extending in the first dimension from an output lead of the programming control driver, to a gate electrode of each of the plurality of programming transistors, and terminating at a gate electrode of the test transistor; and

a test antifuse disposed electrically in series with the test transistor.

2. The programmable integrated circuit of claim 1, wherein during a test mode the programming control driver controls the test transistor to be conductive such that a programming current flows through the test transistor and programs the test antifuse.

3. The programmable integrated circuit of claim 2, wherein during the test mode an electrode of the test transistor is supplied with a programming voltage, but during a normal operating mode the electrode of the test transistor is not supplied with the programming voltage.

4. The programmable integrated circuit of claim 1, further comprising:

a first test conductor extending in the second dimension and being coupled to an electrode of the test transistor; and

a second test conductor extending in the second dimension parallel to the first test conductor and being coupled to the antifuse.

5. The programmable integrated circuit of claim 4, wherein the programming control driver is disposed at one end of the programming control line and the test transistor is located at an opposite end of the programming control line.

6. The programmable integrated circuit of claim 1, wherein the test transistors are smaller than the programming transistors.