Programming architecture for a programmable integrated circuit employing test antifuses and test transistors
First Claim
1. A programmable integrated circuit, comprising:
- a plurality of linearly extending wire segments, the wire segments being substantially collinearly disposed with respect to one another in a first dimension;
a plurality of antifuses, a respective one of the antifuses being disposed between each respective pair of adjacent wire segments;
a plurality of programming conductors extending parallel to one another in a second dimension perpendicular to the first dimension;
a plurality of programming transistors, each respective one of the programming transistors having a first electrode coupled to a corresponding respective one of the wire segments and having a second electrode coupled to a corresponding respective one of the programming conductors;
a programming control driver;
a test transistor;
a programming control line extending in the first dimension from an output lead of the programming control driver, to a gate electrode of each of the plurality of programming transistors, and terminating at a gate electrode of the test transistor; and
a test antifuse disposed electrically in series with the test transistor.
1 Assignment
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Accused Products
Abstract
A programmable integrated circuit (see FIG. 5) has a plurality of linearly extending wire segments with antifuses disposed between each wire segment and a plurality of linearly extending programming conductors that are perpendicular to the wire segments. A plurality of programming transistors are disposed between a corresponding respective one of the wire segments and a corresponding respective one of the programming conductors. A programming control conductor extending from a programming control driver is coupled to the gate electrode of each of the programming transistors as well as the gate electrode of a test transistor. A test antifuse is coupled in series with the test transistor. When the programming control conductor can drive the test transistor with an adequately high voltage to program the test antifuse, it is assumed that the programming control conductor can drive the programming transistor with an adequately high voltage to program the antifuses. The test transistor may be disposed on the programming control conductor at the opposite end from the programming control driver.
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Citations
6 Claims
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1. A programmable integrated circuit, comprising:
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a plurality of linearly extending wire segments, the wire segments being substantially collinearly disposed with respect to one another in a first dimension; a plurality of antifuses, a respective one of the antifuses being disposed between each respective pair of adjacent wire segments; a plurality of programming conductors extending parallel to one another in a second dimension perpendicular to the first dimension; a plurality of programming transistors, each respective one of the programming transistors having a first electrode coupled to a corresponding respective one of the wire segments and having a second electrode coupled to a corresponding respective one of the programming conductors; a programming control driver; a test transistor; a programming control line extending in the first dimension from an output lead of the programming control driver, to a gate electrode of each of the plurality of programming transistors, and terminating at a gate electrode of the test transistor; and a test antifuse disposed electrically in series with the test transistor. - View Dependent Claims (2, 3, 4, 5, 6)
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Specification