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Circuit board inspection apparatus and method employing a rapidly changing electrical parameter signal

  • US 5,969,530 A
  • Filed: 02/27/1998
  • Issued: 10/19/1999
  • Est. Priority Date: 02/28/1997
  • Status: Expired due to Term
First Claim
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1. A printed circuit board inspection apparatus for inspecting conductivity of a plurality of electric paths printed thereon, each of the paths having a first terminal and a second terminal, the apparatus comprising:

  • a plurality of contact probes, each of the contact probes being adapted to be in contact with and electrically connected with each of the first terminals of the paths;

    a signal generator for selectively supplying a test signal to one of the contact probes, the test signal changing its electric parameter rapidly;

    a sensing probe arranged to confront the second terminals of the paths with a gap therebetween to be electrically coupled with the second terminals for allowing the test signal to pass through the gap and picked up by the sensing probe;

    a detector for detecting the signal picked up by the sensing probe while the parameter of the signal is changing in one direction; and

    means for determining whether the detected signal is above or below a predetermined level.

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