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Temperature measuring device

  • US 5,969,639 A
  • Filed: 07/28/1997
  • Issued: 10/19/1999
  • Est. Priority Date: 07/28/1997
  • Status: Expired due to Term
First Claim
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1. A temperature measurement device, comprising:

  • a silicon semiconductor wafer;

    a solid-state temperature sensor mounted on said silicon semiconductor wafer; and

    a signal transmitter adapted to transmit an output signal of said solid-state temperature sensor to an external receiver from approximately -65°

    C., to approximately 200°

    C., said signal transmitter and said solid-state temperature sensor composing a set of integrated circuits disposed directly upon said silicon semiconductor wafer.

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