Microscope apparatus

• US 5,969,855 A
• Filed: 10/11/1996
• Issued: 10/19/1999
• Est. Priority Date: 10/13/1995
• Status: Expired due to Term

• Current Assignee: Olympus Optical Company Ltd. (Olympus Corporation)
• Original Assignee: Olympus Optical Company Ltd. (Olympus Corporation)
• Inventors: Itoh, Masahide, Yatagai, Toyohiko, Ishiwata, Hiroshi
• Primary Examiner(s): NGUYEN, THONG Q
• Application Number:
  US08/729,410
• Time in Patent Office: 1,103 Days
• Field of Search: 359/368-371, 359/385-387, 359/483-499, 359/558-561, 356/351, 356/359, 356/361, 382/279
• US Class Current: 359/386
• CPC Class Codes: G02B 21/14 affording illumination for phase-contrast observation
• CPC Class Codes: G02B 21/367 providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison

Abstract

A microscope apparatus that has an electronic image pickup device arranged on an image surface of an imaging optical system, a component for separating light from a light source into two portions, a device for changing a phase difference between the two portions of light, a device for storing information on the images picked up by the image pickup device, and information processor for processing the information of images. The images are picked up by the electronic image pickup device as the phase difference is changed, and the information on the images is multiplied by a periodic function, as a weight function, which is given the phase difference as variable, and a resultant product is integrated so that a differential interference microscope apparatus capable of accurately obtaining a phase distribution of the object or a phase-contrast microscope apparatus capable of effectively enhancing a resolving power without lowering an image contrast is obtained.

Claims

1. A microscope apparatus comprising:

a light source;

an illumination optical system for introducing light from said light source to an object;

an imaging optical system for obtaining an image of the object;

means for separating the light from said light source into two portions, disposed in said illumination optical system; and

means for superimposing said two portions of the light on one another, disposed in said imaging optical system;

wherein said microscope apparatus further comprises;

an electronic image pickup device arranged on an image surface of said imaging optical system;

means for changing a phase difference between said two portions of the light;

means for storing images picked up by said electronic image pickup device; and

means for processing information on the images picked up by said electronic image pickup device;

wherein the images are picked up by said electronic image pickup device as the phase difference is changed, to be stored as picked-up image information, and said picked-up image information is subjected to an integration process, upon being multiplied by a periodic function, as a weight function, which is given the phase difference as a variable, to produce final process image information.

2. A microscope apparatus according to claim 1, wherein said means for separating the light from said light source into two portions includes means for separating a light wave into an ordinary ray and an extraordinary ray, and said means for superposing the two portions of the light includes means for combining the ordinary ray and the extraordinary ray, so that said apparatus acts as a differential interference microscope apparatus.

3. A microscope apparatus according to claim 2, wherein said periodic function as the weight function is substantially a sine function.

4. A microscope apparatus according to claim 2 or 3, wherein the integration process is performed over an interval of at least one substantial period of said periodic function.

5. A microscope apparatus according to claim 2, wherein the integration process is performed using, independently, at least two periodic functions, as the weight functions, and at least two sets of primary process image information obtained thereby are stored to derive, as linearly combined together, said final process image information.

6. A microscope apparatus according to claim 4, wherein said periodic function, as the weight function, is substantially a sine function and a primary process image information obtained by the integration process is further subjected to an integration process with respect to a separation direction between the ordinary ray and the extraordinary ray using a separation width between the ordinary ray and the extraordinary ray on the object, thereby a shape or a phase distribution of the object with respect to the separation direction being obtained as said final process image information.

7. A microscope apparatus according to claim 4, wherein said periodic function, as the weight function, is substantially a sine function and primary process image information obtained by the integration process is further subjected to a deconvolution process using a separation width between the ordinary ray and the extraordinary ray on the object and a response function of an entire optical system determined by said illumination optical system and said imaging optical system, thereby a shape or a phase distribution of the object being obtained as said final process image information.

8. A microscope apparatus according to claim 1, wherein said means for separating the light from said light source into the two portions includes an annular aperture disposed at a pupil position of said illumination optical system, and said means for superimposing the two portions of the light includes a phase plate which is disposed in a vicinity of a pupil position of said imaging optical system and at which the phase difference between said two portions is changed by said means for changing a phase difference, so that said microscope apparatus acts as a phase-contrast microscope apparatus.

9. A microscope apparatus according to claim 8, wherein said periodic function, as the weight function, is substantially a sine function.

10. A microscope apparatus according to claim 8, wherein the integration process is performed with respect to a plurality of values of the phase difference restricted to an interval of one period of said periodic function as the weight function.

11. A microscope apparatus according to claim 8, wherein the integration process is performed over an interval of at least one period of said periodic function as the weight function.

12. A microscope apparatus according to claims 10 or 11, wherein said periodic function is substantially a sine function and primary process image information obtained by the integration process is further subjected to a deconvolution process using a response function determined by shapes and imaging characteristics of said aperture and said phase plate, thereby a phase distribution of the object being obtained as said final process image information.