Test circuit for verifying operation of an arc fault detector

• US 5,969,920 A
• Filed: 03/27/1998
• Issued: 10/19/1999
• Est. Priority Date: 03/27/1998
• Status: Expired due to Term

• Current Assignee: Eaton Corp. (Wisconsin) (Eaton Corporation PLC.)
• Original Assignee: Eaton Corp. (Wisconsin) (Eaton Corporation PLC.)
• Inventors: Mackenzie, Raymond Warren
• Primary Examiner(s): Leja, Ronald W.
• Application Number:
  US09/049,318
• Time in Patent Office: 571 Days
• Field of Search: 361/42, 361/44-50, 361/79, 361/87, 361/93, 361/94, 361/99, 324/76.42, 324/76.43, 324/76.44, 324/76.45, 324/520-523, 324/541, 324/544, 702/FOR 104, 702/FOR 106, 702/FOR 107, 702/FOR 109
• US Class Current: 361/42
• CPC Class Codes: G01R 31/3277 of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches
• CPC Class Codes: H02H 1/0015 Using arc detectors
• CPC Class Codes: H02H 3/044 Checking correct functioning of protective arrangements, e.g. by simulating a fault for differential current circuit breakers H02H3/335

Abstract

A test circuit for arc fault detectors of the type which respond to step changes in ac current over time generated each time an arc is struck includes a low frequency relaxation oscillator which generates a repetitive signal with step changes like those produced by an arc fault. The relaxation oscillator includes a capacitor charged through a resistor and shunted by a voltage breakdown device, preferably a diac. The capacitor is rapidly discharged when its voltage reaches the breakdown voltage of the voltage breakdown device to generate the step change which is input to the arc fault detector. With a repetition rate of the relaxation oscillator not greater than about 15 repetitions per second (rps), and preferably about 5 rps, a user can manually determine the time to trip to verify arc fault detector operation. With the oscillator operating at such a low frequency, a signaling device such as a light emitting diode (LED) placed in series with the voltage breakdown device, permits the user to manually count the number of step changes required to produce a trip thereby providing further verification of detector operability.

Claims

1. A test circuit for testing an arc fault detector which responds to a plurality of step increases in an alternating current in an ac power system caused by an arc fault over a period of time, said test circuit comprising:

a power source;

a relaxation oscillator powered by said power source for generating a repetitive signal having step changes, said signal having a selected repetition rate of not more than about 15 per second; and

coupling means coupling said repetitive signal to said arc fault detector.

2. The test circuit of claim 1 wherein said relaxation oscillator comprises a capacitor, a resistor through which said capacitor is charged by said power source, and a voltage breakdown device shunting said capacitor, the values of said resistor and capacitor, and a breakdown voltage of said voltage breakdown device being selected to provide said selected repetition rate.

3. The test circuit of claim 2 wherein said power source comprises rectifier means connected to said ac power system.

4. The test circuit of claim 2 wherein said coupling means comprises circuit means applying voltage across said capacitor to said arc fault detector.

5. The test circuit of claim 4 adapted for use with an arc fault detector which responds only to step changes in said ac current having at least a minimum amplitude, wherein said circuit means comprises components applying said repetitive signal to said arc fault detector at about said minimum amplitude.

6. The test circuit of claim 4 wherein said circuit means comprise a series resistor and capacitor.

7. The test circuit of claim 6 wherein said voltage break down device is a diac.

8. The test circuit of claim 7 wherein said power source comprises rectifier means connected to said ac power system.

9. The test circuit of claim 5 including a signaling device in series with said voltage break down device.

10. The test circuit of claim 9 wherein said signaling device comprises a light emitting diode.

11. The test circuit of claim 2 including a signaling device in series with said voltage break down device.

12. The test circuit of claim 11 wherein said signaling device comprises a light emitting diode.

13. The test circuit of claim 12 wherein said voltage break down device comprises a diac.

14. The test circuit of claim 1 wherein said relaxation oscillator includes a signaling device identifying each step change in said repetitive signal.

15. The test circuit of claim 14 wherein said signaling device is a light emitting diode.

16. The test circuit of claim 1 wherein said relaxation oscillator generates a repetitive signal with a repetition rate between about 15 per second and about 1 per second.