Method and apparatus for measuring threshold characteristic of semiconductor integrated circuit

• US 5,970,074 A
• Filed: 06/27/1996
• Issued: 10/19/1999
• Est. Priority Date: 07/21/1995
• Status: Expired due to Term

• Current Assignee: Sharp Kabushiki Kaisha (Hon Hai Precision Industry Co., Ltd.)
• Original Assignee: Sharp Kabushiki Kaisha (Hon Hai Precision Industry Co., Ltd.)
• Inventors: Ehiro, Masayuki
• Primary Examiner(s): Nguyen, Hoa T.
• Application Number:
  US08/670,492
• Time in Patent Office: 1,209 Days
• Field of Search: 371/28, 364/483, 364/551.01, 361/79, 361/86, 361/87, 340/853.2, 324/76.11, 324/158.1
• US Class Current: 714/745
• CPC Class Codes: G01R 31/30 Marginal testing, e.g. by varying supply voltage testing computers during standby operation or idle time G06F11/22

Abstract

To measure the threshold characteristics of an integrated circuit processing a Schmitt circuit at the input side, a clock signal generated from a signal generator is fed to the integrated circuit, and a change of a power source current supplied from a power source circuit to the integrated circuit is detected by a change detector. A control circuit sets the amplitude of a clock signal generated by a driver circuit through digital-to-analog converting circuits. Initially, the voltages of the signal at the high level side and low level side are both set at 0.00 V, and when the voltage of the signal at the high level side, increasing by 0.01 V at a time, reaches the threshold of the Schmitt circuit, a large power source current flows, and a voltage change between the ends of a resistor is detected. As a part of a function test of a test apparatus, the threshold characteristic of the integrated circuit is measured.

Claims

1. A method for measuring a threshold characteristic of a semiconductor integrated circuit having an operational state which is shifted depending on whether an input signal voltage is above or below a threshold, said method comprising the steps of:

inputting a clock signal into the integrated circuit, the clock signal having a predetermined reference voltage which is significantly greater than or less than an approximate threshold voltage and a peak voltage which is offset by a variation amount toward the approximate threshold voltage from the predetermined reference voltage;

measuring a current level supplied from a power source to the semiconductor integrated circuit;

changing the peak voltage of the clock signal by a predetermined amount to obtain an updated clock signal;

inputting the updated clock signal into the semiconductor integrated circuit;

repeating the step of measuring the current level supplied from the power source to the semiconductor integrated circuit to obtain an updated current level; and

determining whether the updated current level differs from the current level obtained by the previous measuring step by more than a predetermined amount and, if so, deciding that the peak voltage of the updated clock signal is the threshold.

2. The method for measuring a threshold characteristic of a semiconductor integrated circuit of claim 1, wherein the hysteresis characteristic of the threshold voltage for peak voltage changes from a high voltage side to a low voltage side, is different than that for peak voltage changes from a low voltage side to a high voltage side, and

a first threshold is measured by setting a first predetermined reference, voltage of the clock signal at a level significantly greater than an approximate first threshold voltage, and repeatedly decreasing the peak voltage of the clock signal, and a second threshold is measured by setting a second predetermined voltage of the clock signal at a level significantly less than an approximate second threshold voltage, and repeatedly increasing the peak voltage of the clock signal.

3. The method for measuring a threshold characteristic of a semiconductor integrated circuit of claim 2, wherein the semiconductor integrated circuit includes a Schmitt circuit.

4. The method for measuring a threshold characteristic of a semiconductor integrated circuit of claim 1, wherein the semiconductor integrated circuit is a CMOS type large scale integrated circuit.

5. The method for measuring a threshold characteristic of a semiconductor integrated circuit of claim 1, wherein the clock signal fed as the input signal is changed according to a predetermined test pattern to measure the threshold as a part of function test.

6. An apparatus for measuring a threshold characteristic of a semiconductor integrated circuit having an input circuit whose operation state varies depending on whether an input signal voltage is above or below a threshold, the apparatus comprising:

signal generating means for repeatedly generating as an input signal to be fed to the semiconductor integrated circuit, a clock signal having an amplitude within a range from a predetermined reference voltage which is significantly greater or less than an approximate threshold voltage to a peak voltage which differs by a variation amount toward the approximate threshold voltage from the predetermined reference voltage, and sequentially changing the peak voltage of the clock signal by a predetermined variation amount at a time;

change detecting means for detecting a change of a power source current supplied to the semiconductor integrated circuit; and

measuring means for responding to an output from the change detecting means and measuring the peak voltage of the input signal outputted from the signal generating means as the threshold, when the change of the power source current exceeds a predetermined range.

7. The apparatus for measuring threshold characteristic of a semiconductor integrated circuit of claim 6, wherein the signal generating means includes:

first and second digital-to-analog converting circuits for converting an input digital signal into a direct-current voltage, and

a clock signal generating circuit for generating a clock signal having an amplitude ranging between direct-current voltages output from the first and second digital-to-analog converting circuits, and

the measuring means feeds a digital signal corresponding to a specific voltage to be used as the reference voltage to one of the first and second digital-to-analog converting circuits, feeds a digital signal corresponding to the voltage to be used as the peak voltage to the other of the first and second digital-to-analog converting circuits, and measures the peak voltage at the time when the change of the power source current detected by the change detecting means exceeds the predetermined range as the threshold.

8. A method for measuring threshold characteristics of an integrated circuit which includes a input circuit having an operation state which varies depending on whether an input signal voltage is above or below a threshold, said method comprising the steps of:

(a) setting a first reference signal at a predetermined voltage level which is significantly greater than or less than an approximate threshold level;

(b) setting a first peak voltage at the first reference voltage level;

(c) inputting a clock signal to the integrated circuit, the clock signal varying between the first reference signal and the first peak voltage;

(d) determining whether a current signal output from the integrated circuit indicates that a threshold level has been reached and deciding that the input first peak voltage is a first threshold value when the output current signal indicates that a threshold level has been reached;

(e) when said step (d) does not indicate that a threshold level has been reached, changing the first peak voltage by a predetermined amount; and

(f) repeating said steps (c)-(e) until it is indicated that either a threshold level has been reached or that an entire range of potential first peak voltages has been input to the integrated circuit.

9. A method according to claim 8, further comprising the steps of:

(g) setting a second reference signal at a predetermined voltage level which is on the other side of an approximate threshold level than the first reference signal;

(h) setting a second peak voltage at the second reference voltage level;

(i) inputting a clock signal to the integrated circuit, the clock signal varying between the second reference signal and the second peak voltage;

(j) determining whether a current signal output from the integrated circuit indicates that a threshold level has been reached and deciding that the input second peak voltage is a second threshold value when the output current signal indicates that a threshold level has been reached;

(k) when said step (j) does not indicate that a threshold level has been reached, changing the second peak voltage by a predetermined amount; and

(l) repeating said steps (i)-(k) until is indicated that a threshold level has been reached or that an entire range of potential second peak voltages has been input to the integrated circuit.

10. The method according to claim 8, wherein the input circuit is a Schmitt circuit.

11. An apparatus for measuring threshold characteristics of an integrated circuit which includes an input circuit having an operation state which varies depending on whether an input signal voltage is above or below a threshold, said apparatus comprising;

a signal generator which generates a reference signal which is significantly greater or less than an approximate threshold level, an adjustable peak voltage which is sequentially adjusted toward the approximate threshold level, and a clock signal which varies between the generated reference signal and the adjustable peak voltage;

a change detector which detects when a current signal output by the integrated circuit indicates that a threshold level has been reached; and

a test circuit for determining, as a threshold level, the peak voltage resulting in an indication from said change detector that a threshold level had been reached.

12. The apparatus according to claim 11, wherein said signal generator includes a first digital-to-analog convertor for generating the reference signal, a second digital-to-analog convertor for generating the peak voltage, and a driver which receives the reference signal and peak voltage and outputs the clock signal to the integrated circuit.

13. The apparatus according to claim 12, wherein said first and second digital-to-analog convertors and said driver are controlled by said test circuit.

14. The apparatus according to claim 11, wherein said change detector includes a differential amplifier and an RS flip-flop.

15. The apparatus according to claim 11, wherein the input circuit is a Schmitt circuit.