Method of manufacturing semiconductor device
First Claim
1. A method of manufacturing a semiconductor device, comprising the steps of:
- forming a channel layer of one conductivity type on a surface of a semiconductor substrate;
forming a mask layer having a plural of openings on said semiconductor substrate;
forming an insulating film on said mask layer to cover said openings of said mask layer;
etching said insulating film to form side walls beside walls of said openings of said mask layer;
etching said semiconductor substrate to form trenches extending through said channel layer of said semiconductor substrate using said side walls as a mask.
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Accused Products
Abstract
A first conductivity layer and a first insulating film are successively formed on a channel layer, and a photoresist film is formed on the first insulating film. The photoresist film is selectively exposed to light using a photomask and patterned. Using the patterned photoresist film as a mask, the first insulating film and the first conductivity layer are etched to form source electrodes from the first conductivity layer. Using the first insulating film and the source electrodes as a mask, an impurity of one conductivity type is diffused into exposed portions of the channel layer to form source regions. A second insulating film is formed in covering relation to side walls and upper surfaces of the source electrodes. Using the second insulating film as a mask, the channel layer and the common drain layer are etched to form trenches in the source regions, the channel layer, and the common drain layer. A third insulating film is formed on surfaces of the trenches, and a second conductive layer is formed as a gate electrode on the entire surface so as to fill up the trenches and cover the second insulating film.
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Citations
8 Claims
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1. A method of manufacturing a semiconductor device, comprising the steps of:
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forming a channel layer of one conductivity type on a surface of a semiconductor substrate; forming a mask layer having a plural of openings on said semiconductor substrate; forming an insulating film on said mask layer to cover said openings of said mask layer; etching said insulating film to form side walls beside walls of said openings of said mask layer; etching said semiconductor substrate to form trenches extending through said channel layer of said semiconductor substrate using said side walls as a mask. - View Dependent Claims (2, 4, 5, 6, 8)
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3. A method of manufacturing a semiconductor device, comprising the steps of:
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forming a common drain layer of one conductivity type on a surface of a semiconductor substrate of said one conductivity type; diffusing a first impurity of a conductivity type different from said one conductivity type into an entire surface of said common drain layer to form a channel layer thereon; forming a first conductivity layer on said channel layer; forming a first insulating film on said first conductivity layer; etching said first insulating film and said first conductivity layer to form source electrodes from said first conductivity layer, diffusing a second impurity of said one conductivity type into exposed portions of said channel layer to form source regions, using said first insulating film and said source electrodes as a mask; forming a second insulating film in covering relation to side walls and upper surfaces of said source electrode; etching said channel layer and said common drain layer to form trenches in said source regions, said channel layer, and said common drain layer, using said second insulating film as a mask; forming a third insulating film on surfaces of said trenches; forming a second conductive layer as a gate electrode on the entire surface so as to fill up said trenches and cover said second insulating film; and forming an interconnection layer on said second conductive layer.
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7. A method of manufacturing a semiconductor device, comprising the steps of:
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forming a common drain layer of one conductivity type on a surface of a semiconductor substrate of said one conductivity type; forming a first conductive layer on said common drain layer; forming a first insulating film on said first conductive layer; removing the exposed portions of said first insulating film to form source electrodes from remaining portions of said first insulating film; introducing a first impurity of a conductivity type different from said one conductivity type into exposed portions of said common drain layer, using said source electrodes as a mask, and diffusing said first impurity to form channel regions; introducing a second impurity of said one conductivity type into said exposed portions of said common drain layer, using said source electrodes as a mask, and diffusing said second impurity to form source regions; forming a second insulating film in covering relation to side walls and upper surfaces of said source electrodes; forming trenches in said channel regions, said source regions, and said common drain layer; forming a third insulating film on surfaces of said trenches; and forming a second conductive layer as a gate electrode on the entire surface so as to fill up said trenches and cover said second insulating film.
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Specification