×

System for measuring the location and orientation of an object

  • US 5,974,365 A
  • Filed: 10/23/1997
  • Issued: 10/26/1999
  • Est. Priority Date: 10/23/1997
  • Status: Expired due to Fees
First Claim
Patent Images

1. A system for aligning together a first six-DOF object and a second six-DOF object by simultaneously measuring the six degrees of freedom (DOF) of said second object and displaying the six position measurements and manipulating said first six-DOF object relative to said second six-DOF object until the six position measurements reach pre-determined desired values, said system comprising:

  • a pre-selected pattern attached to said second object;

    a detector array, said array being fixedly mounted on said first object;

    an aperture suitably positioned to provide said detector array a field of view, said array producing signals that are indicative of the relative locations and orientations of said first and second objects;

    a computer processor having resident therein pre-selected algorithms, said processor being coupled to said array to receive therefrom said signals and being adapted for, using said resident algorithms, converting said signals to the six position measurements; and

    a display unit, said display unit being coupled to said processor to receive therefrom said six position measurements and display said measurements for viewing by the operator, thereby enabling the operator to manipulate said first six-DOF object until the six position measurements reach the pre-determined desired values.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×