Non-vibrating capacitance probe for wear monitoring

• US 5,974,869 A
• Filed: 11/14/1997
• Issued: 11/02/1999
• Est. Priority Date: 11/14/1996
• Status: Expired due to Term

• Current Assignee: Georgia Tech Research Corporation (University System of Georgia)
• Original Assignee: Georgia Tech Research Corporation (University System of Georgia)
• Inventors: Zanoria, Elmer, Hamall, Kenneth M., Danyluk, Steven, Zharin, Anatoly, Reid, Lennox
• Primary Examiner(s): LARKIN, DANIEL SEAN
• Application Number:
  US08/971,101
• Time in Patent Office: 718 Days
• Field of Search: 73/104, 73/105, 324/663, 324/686, 324/690, 324/457, 324/458
• US Class Current: 73/105
• CPC Class Codes: G01R 1/07 Non contact-making probes

Abstract

A non-vibrating capacitance probe for use as a non-contact sensor for tribological wear on a component. The device detects surface charge through temporal variation in the work function of a material. A reference electrode senses changing contact potential difference over the component surface, owing to compositional variation on the surface. Temporal variation in the contact potential difference induces a current through an electrical connection. This current is amplified and converted to a voltage signal by an electronic circuit with an operational amplifier.

Claims

1. An apparatus for monitoring surface variations on a component, said apparatus comprising:

(a) a non-vibrating capacitance probe;

(b) means for positioning said non-vibrating capacitance probe in proximity to the component; and

(c) means for measuring the contact potential difference between the component and said non-vibrating capacitance probe.

2. An apparatus according to claim 1, further comprising a means for measuring the relative motion between the component and said non-vibrating capacitance probe.

3. An apparatus according to claim 2, further comprising means for regulating the relative motion between the component and said non-vibrating capacitance probe.

4. An apparatus according to claim 1, further comprising means for measuring the spatial distance between the component and said non-vibrating capacitance probe.

5. An apparatus according to claim 1, further comprising a means for supporting the component.

6. An apparatus according to claim 5, wherein said means for positioning said non-vibrating capacitance probe in proximity to the component is fixed relative to said means for supporting the component.

7. An apparatus according to claim 1, wherein said surface variation is surface wear.

8. A process for monitoring surface variations on a component, comprising the following steps:

(a) imparting relative motion between the component and a non-vibrating capacitance probe;

(b) monitoring the relative motion between the component and the non-vibrating capacitance probe; and

(c) monitoring the contact potential difference between the component and the non-vibrating capacitance probe.

9. A process according to claim 8, further comprising the step of monitoring the distance between the said test surface and the non-vibrating capacitance probe.

10. A process according to claim 9, wherein the surface variation is surface wear.