Method and system for optimizing cathode output for aging a cathode ray tube during manufacture

• US 5,977,711 A
• Filed: 10/27/1997
• Issued: 11/02/1999
• Est. Priority Date: 10/27/1997
• Status: Expired due to Fees

• Current Assignee: Sony Corporation (Sony Group Corp.), Sony Electronics Inc. (Sony Group Corp.)
• Original Assignee: Sony Corporation (Sony Group Corp.), Sony Electronics Inc. (Sony Group Corp.)
• Inventors: McElroy, Alexander, Van Du, Vincent, Nakazono, Hiroyuki
• Primary Examiner(s): Westin, Edward P.
• Assistant Examiner(s): Gardner, Shane R.
• Application Number:
  US08/958,096
• Time in Patent Office: 736 Days
• Field of Search: 345/11, 345/12, 345/20, 345/207, 315/9, 315/10, 315/13.1, 315/30, 348/178, 348/190, 348/379, 348/380, 445/6, 445/62
• US Class Current: 315/30
• CPC Class Codes: H04N 17/04 for receivers

Abstract

The present invention relates to a method and system for optimizing the output of at least two electron guns in a cathode ray tube for aging the cathode ray tube during manufacture. The system comprises at least two electron guns located in the cathode ray tube and a memory configured to store an offset value that is representative of a difference between a maximum output level and a detected output level for each of the electron guns. The system further comprises a processor coupled to the memory. The processor generates a first scaled signal by adding a first signal representative of an input voltage corresponding to the detected output level of the first electron gun and an offset signal representative of the offset value, and a second scaled signal by adding a second signal representative of an input voltage corresponding to the detected output level of the second electron gun and the offset signal. A first summing circuit is coupled between the processor and the first electron gun, which combines a first control signal and the first scaled signal to provide a first aging signal to the first electron gun. A second summing circuit is coupled between the processor and the second electron gun, which combines a second control signal and the second scaled signal to provide a second aging signal to the second electron gun. The optimizing technique may also be applied to a third electron gun.

Claims

1. A system for aging a cathode ray tube during manufacture, comprising:

a first electron gun located in the cathode ray tube;

a second electron gun located in the cathode ray tube;

a memory configured to store a first detected output level value of the first electron gun, a second detected output level value of the second electron gun, and an offset value, wherein the offset value is the smaller of a first value and a second value, where the first value is representative of a difference between a maximum output level value and the first detected output level value, and the second value is representative of a difference between the maximum output level value and the second detected output level value;

a processor coupled to the memory, said processor generating a first scaled value by adding the first detected output level value and the offset value, and a second scaled value by adding the second detected output level value and the offset value;

a first summing circuit coupled to the processor and the first electron gun, said first summing circuit providing a first aging signal to the first electron gun based on a first control value and the first scaled value; and

a second summing circuit coupled to the processor and the second electron gun, said second summing circuit providing a second aging signal to the second electron gun based on a second control value and the second scaled value.

2. The system of claim 1, further comprising:

a third electron gun located in the cathode ray tube;

wherein said memory is configured to store a third detected output level value of the third electron gun, and wherein the offset value is the smaller of the first values, the second value, and a third value, where the third value is representative of a difference between the maximum output level value and the third detected output level value;

wherein said processor generates a third scaled value by adding the third detect output level value and the offset signal;

a third summing circuit coupled to the processor and the third electron gun, said third summing circuit providing a third aging signal to the third electron gun based on a third control value and the third scaled value.

3. The system of claim 1, further comprising a control circuit responsive to said processor and coupled to said first summing circuit and said second summing circuit, said control circuit generating a first scaled signal based on the first scaled value from said processor, and a second scaled signal based on the second scaled value from said processor.

4. The system of claim 3, further comprising a video processing circuit coupled between said first and second summing circuits and said processor, said video processing circuit generating a first control signal based on the first control valued from said processor and a second control signal based on the second control value from said processor.

5. The system of claim 4, wherein said first summing circuit sums said first control signal and said first scaled signal and provides a resulting first analog aging signal as the first aging signal, and said second summit circuit sums said second control signal and said second scaled signal and provides a resulting second analog aging signal as the second aging signal.

6. The system of claim 1, further comprising a sensor that detects a first color temperature corresponding to a first detected output level of the first electron gun and a second color temperature corresponding to a second detected output level of the second electron gun, and an adjustment circuit coupled between said sensor and said processor, said adjustment circuit determining the first detected output level value corresponding to said first color temperature and the second detected output level value corresponding to said second color temperature, said adjustment circuit providing said first detected output level value of the first electron gun and said second detected output level value of the second electron gun to said processor.

7. The system of claim 1, wherein the memory is an erasable electrically programmable read only memory.

8. A method for aging a cathode ray tube during manufacture, comprising:

storing a first detected output level value of a first electron gun;

storing a second detected output level value of a second electron gun;

storing an offset value, wherein the offset value is the smaller of a first value and a second value, where the first value is representative of a difference between a maximum output level and the first detected output level value, and the second value is representative of a difference between the maximum output level value and the second detected output level value;

generating a first scaled value by adding the first detected output level value and the offset value;

generating a second scaled value by adding a the second detected output level value and the offset value;

providing a first aging signal to the first electron gun based on a first control value and the first scaled value; and

providing a second aging signal to the second electron gun based on a second control value and the second scaled value.

9. The method of claim 8, further comprising:

storing a third detected output level value of a third electron gun;

wherein in storing the offset value, the offset value further is the smaller the first value, the second value, and a third value, where the third value is representative of a difference between the maximum output level value and the third detected output level value;

generating a third scaled value by adding the third detected output level value and the offset value;

providing a third aging signal to the third electron gun based on a third control value and the third scaled value.

10. The method of claim 8, further comprising:

detecting a first color temperature corresponding to a first detected output level of the first electron gun;

detecting a second color temperature corresponding to a second detected output level of the second electron gun;

determining the first detected output level value corresponding to said first color temperature;

determining the second detected output level value corresponding to said second color temperature.

11. The method of claim 8, further comprising generating a first scaled signal based on said first scaled value, and generating a second scaled signal based on said second scaled value.

12. The method of claim 11, further comprising generating a first control signal based on said first control value, and generating a second control signal based on said second control value.

13. The method of claim 12, wherein in combining, said first control signal and said first scaled signal are combined to provide a resulting first analog aging signal as the first aging signal, and said second control signal and said scaled second signal are combined to provide a resulting second analog aging signal as the second aging signal.