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Bit line biasing method to eliminate program disturbance in a non-volatile memory device and memory device employing the same

  • US 5,978,267 A
  • Filed: 10/20/1998
  • Issued: 11/02/1999
  • Est. Priority Date: 10/20/1998
  • Status: Expired due to Term
First Claim
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1. A method of programming a non-volatile memory device comprising a plurality of bit lines, a plurality of word lines, a select drain gate and a select source gate, the method comprising the steps of:

  • (a) applying a first word line voltage of about 20 V to a first one of the word lines, the first word line voltage representing a word program signal for a respective word on the first word line;

    (b) applying a second word line voltage of about 10 V to a second one of the word lines, the second word line voltage representing a word program-inhibit signal for a respective word on the second word line;

    (c) applying a bias voltage in the range of about 0.1 V to about 0.3 V to a first one of the bit lines for a respective first memory gate which is disposed on the first word line, to program the first memory gate with a logic bit representing a programmed state; and

    (d) applying a select drain gate voltage to a second one of the bit lines for a respective second memory gate which is also disposed on the first word line such that the second memory gate maintains a logic bit representing a program-inhibited state.

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