Bit line biasing method to eliminate program disturbance in a non-volatile memory device and memory device employing the same
First Claim
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1. A method of programming a non-volatile memory device comprising a plurality of bit lines, a plurality of word lines, a select drain gate and a select source gate, the method comprising the steps of:
- (a) applying a first word line voltage of about 20 V to a first one of the word lines, the first word line voltage representing a word program signal for a respective word on the first word line;
(b) applying a second word line voltage of about 10 V to a second one of the word lines, the second word line voltage representing a word program-inhibit signal for a respective word on the second word line;
(c) applying a bias voltage in the range of about 0.1 V to about 0.3 V to a first one of the bit lines for a respective first memory gate which is disposed on the first word line, to program the first memory gate with a logic bit representing a programmed state; and
(d) applying a select drain gate voltage to a second one of the bit lines for a respective second memory gate which is also disposed on the first word line such that the second memory gate maintains a logic bit representing a program-inhibited state.
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Abstract
In the programming of a non-volatile memory device, such as a NAND flash memory device 100, a positive bias voltage Vbias is applied to a bit line 44 to set a respective memory gate 44a in a programmed state. In a further embodiment, the positive bias voltage Vbias is obtained by dividing the select drain gate voltage Vcc using two resistors 56 and 58 connected in series.
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Citations
10 Claims
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1. A method of programming a non-volatile memory device comprising a plurality of bit lines, a plurality of word lines, a select drain gate and a select source gate, the method comprising the steps of:
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(a) applying a first word line voltage of about 20 V to a first one of the word lines, the first word line voltage representing a word program signal for a respective word on the first word line; (b) applying a second word line voltage of about 10 V to a second one of the word lines, the second word line voltage representing a word program-inhibit signal for a respective word on the second word line; (c) applying a bias voltage in the range of about 0.1 V to about 0.3 V to a first one of the bit lines for a respective first memory gate which is disposed on the first word line, to program the first memory gate with a logic bit representing a programmed state; and (d) applying a select drain gate voltage to a second one of the bit lines for a respective second memory gate which is also disposed on the first word line such that the second memory gate maintains a logic bit representing a program-inhibited state. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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Specification