Spectrometer for X-radiation

• US 5,978,445 A
• Filed: 03/19/1997
• Issued: 11/02/1999
• Est. Priority Date: 10/27/1994
• Status: Expired due to Fees

• Current Assignee: Forschungszentrum Karlsruhe Gmbh
• Original Assignee: Forschungszentrum Karlsruhe Gmbh
• Inventors: Schultheiss, Christoph, Jakobi, deceased, Waldemar
• Primary Examiner(s): Church, Craig E.
• Application Number:
  US08/666,443
• Time in Patent Office: 958 Days
• Field of Search: 378/82, 378/84, 378/85, 378/145
• US Class Current: 378/82
• CPC Class Codes: G01T 1/36 Measuring spectral distribution of X-rays or of nuclear radiation spectrometry pulse selection circuits per se H03K; investigation of materials by radiation diffraction G01N23/20; spectrometer tubes H01J49/00
• CPC Class Codes: G21K 1/025 using multiple collimators, e.g. Bucky screens; other devices for eliminating undesired or dispersed radiation

Abstract

The invention relates to a spectrometer for X-radiation, including a disk which is impervious to the radiation and which has a first and a second surface provided with a plurality of channels or bores measuring a maximum of 50 μm. The bores are disposed in such a manner that they extend from the first to the second disk surface and their extensions point toward a common line or a common point, with the common line or common point being located opposite the second surface. Also provided is a device with the aid of which the arching of the disk can be altered in such a way that the distance of the common line or common point from the concave surface changes.

Claims

1. A spectrometer for X-radiation, comprising

an arched disk comprised of a material impervious to X-radiation, said disc having a convex and a concave surface, and having a plurality of through bores, each bore extending from the convex to the concave surface and having a maximum diameter of 50 μ

m, each bore further having a longitudinal axis that essentially points toward one of a common line and common point located opposite the concave surface; and

means in engagement with said disc for altering an arching of said disc so that a distance of the common line or common point from the concave surface is changed.

2. The spectrometer defined in claim 1, wherein said bores have a maximum diameter of 10 μ

m.