Memory cell capable of storing more than two logic states by using different via resistances

• US 5,982,659 A
• Filed: 12/23/1996
• Issued: 11/09/1999
• Est. Priority Date: 12/23/1996
• Status: Expired due to Term

• Current Assignee: Avago Technologies General IP PTE Limited (Broadcom, Inc.)
• Original Assignee: LSI Logic Corporation (Broadcom, Inc.)
• Inventors: Irrinki, V. Swamy, Wik, Thomas R., Leung, Raymond T., Kapoor, Ashok, Owens, Alex
• Primary Examiner(s): ZARABIAN, AMIR
• Application Number:
  US08/779,998
• Time in Patent Office: 1,051 Days
• Field of Search: 365/168, 365/185.03, 365/100, 365/105, 365/175, 365/148
• US Class Current: 365/168
• CPC Class Codes: G11C 11/56 using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
• CPC Class Codes: G11C 11/5692 read-only digital stores using storage elements with more than two stable states
• CPC Class Codes: G11C 17/00 Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
• CPC Class Codes: G11C 7/16 Storage of analogue signals in digital stores using an arrangement comprising analogue/digital [A/D] converters, digital memories and digital/analogue [D/A] converters

Abstract

A process which enables storage of more than two logic states in a memory cell. In one embodiment, a via is used to couple a diode between a word read line and a data read line. The via has a resistance which is set to one of a plurality of values at the time of manufacture. When the word read line is asserted, the voltage drop sustained across the via is indicative of the stored logic state. An analog-to-digital (A/D) converter is coupled to the data read line so as to sense the voltage drop and determine the state represented. Since the additional logic states may be used to represent additional information bits, this memory circuit increases the number of bits that may be stored per memory cell, thereby increasing the storage density and reducing the cost per bit.

Claims

1. A memory circuit comprising:

an array of vias forming a memory structure wherein each of said vias is selectively sized to set an associated storage state, wherein differing vias forming said array have differing sizes, wherein said each of the vias is coupled between a word line and a read line, wherein said each of the vias is configured to sustain a voltage drop when the word read line is asserted;

a diode coupled between the word read line and the data read line in series with said each of the vias, wherein the diode is configured to allow said each of the vias to sustain the voltage drop only when the word read line is asserted; and

an analog-to-digital converter coupled to said array of vias and configured to detect a voltage across selected ones of said vias to thereby determine said associated storage state of each of said selected vias, wherein the analog-to-digital converter is further configured to detect a value indicative of the voltage drop.

2. The memory circuit of claim 1, wherein the via has a resistance which is set to determine the voltage drop, said resistance is set to one of at least three magnitudes.

3. The memory circuit of claim 1, wherein the via has a size which is set to determine the voltage drop.

4. The memory circuit of claim 1, wherein the via has a depth which is set to determine the voltage drop.

5. The memory circuit of claim 1, wherein the analog-to-digital converter comprises a plurality of comparators, wherein each of the plurality of comparators is coupled to compare the voltage drop to one of a plurality of reference voltages.

6. The memory circuit of claim 5, wherein the number of comparators equals the number of reference voltages, and wherein the number of reference voltages is equal to one less than a number of distinct digital values.

7. The memory circuit of claim 1, further comprising an address decoder configured to assert the word read line in response to receiving an address signal and an enable signal.

8. The memory circuit of claim 1, further comprising a data gate configured to convert m logic signals, each of the m logic signals having one of the distinct digital values, into n binary data bits during a read operation.

9. The memory circuit of claim 8, wherein the analog-to-digital converter is configured to provide the one of the distinct digital values to the data gate.

10. The memory circuit of claim 1, further comprising a sense amplifier coupled to detect the voltage drop, wherein the sense amplifier is configured to responsively provide the value to the analog-to-digital converter.

11. The memory circuit of claim 1, wherein the analog-to-digital converter is configured to convert the value to one of four distinct digital values.

12. The memory circuit of claim 1, wherein the analog-to-digital converter is configured to convert the value to one of sixteen distinct digital values.

13. A memory circuit comprising:

an array of vias forming a memory structure, wherein each of said vias is selectively sized to set an associated storage state, wherein the associated storage states include at least three states, wherein differing vias forming said array have differing sizes each corresponding to one of the at least three states, wherein said each of the vias is coupled between a word line and a read line, wherein said each of the vias is configured to sustain a voltage drop when the word read line is asserted; and

an analog-to-digital converter coupled to the array of vias and configured to detect a voltage across selected ones of said vias to thereby determine said associated storage state of each of said selected vias, wherein the analog-to-digital converter is further configured to detect a value indicative of the voltage drop;

wherein said each of the vias has a size which is set to determine the voltage drop.

14. The memory circuit of claim 13, wherein the memory circuit further comprises a diode coupled between the word read line and the data read line in series with said each of the vias, wherein the diode is configured to allow said each of the vias to sustain the voltage drop only when the word read line is asserted.

15. The memory circuit of claim 13, wherein the via has a depth which is set to determine the voltage drop.

16. The memory circuit of claim 13, wherein the analog-to-digital converter comprises a plurality of comparators, wherein each of the plurality of comparators is coupled to compare the voltage drop to one of a plurality of reference voltages.

17. The memory circuit of claim 13, further comprising a sense amplifier coupled to detect the voltage drop, wherein the sense amplifier is configured to responsively provide the value to the analog-to-digital converter.

18. A memory circuit comprising:

an array of vias forming a memory structure wherein each of said vias is selectively sized to set an associated storage state, wherein differing vias forming said array have differing sizes, wherein said each of the vias is coupled between a word line and a read line, wherein said each of the vias is configured to sustain a voltage drop when the word read line is asserted; and

an analog-to-digital converter coupled to said array of vias and configured to detect a voltage across selected ones of said vias to thereby determine said associated storage state of each of said selected vias, wherein the analog-to-digital converter is further configured to detect a value indicative of the voltage drop;

wherein said each of the vias has a resistance which is set to determine the voltage drop, and wherein said resistance is set to one of at least three magnitudes.

19. A memory circuit comprising:

an array of vias forming a memory structure, wherein each of said vias is selectively sized to set an associated storage state, wherein the associated storage states include at least three states, wherein differing vias forming said array have differing sizes each corresponding to one of the at least three states, wherein said each of the vias is coupled between a word line and a read line, wherein said each of the vias is configured to sustain a voltage drop when the word read line is asserted;

a diode coupled between the word read line and the data read line in series with said each of the vias, wherein the diode is configured to allow said each of the vias to sustain the voltage drop only when the word read line is asserted; and

an analog-to-digital converter coupled to the array of vias and configured to detect a voltage across selected ones of said vias to thereby determine said associated storage state of each of said selected vias, wherein the analog-to-digital converter is further configured to detect a value indicative of the voltage drop.