In-sheet transceiver testing

• US 5,983,363 A
• Filed: 09/15/1994
• Issued: 11/09/1999
• Est. Priority Date: 11/20/1992
• Status: Expired due to Term

• Current Assignee: Round Rock Research LLC
• Original Assignee: Micron Communications, Inc. (Micron Technology, Inc.)
• Inventors: Tuttle, John R., Tuttle, Mark E., Lake, Rickie C., Schicht, Steven F.
• Primary Examiner(s): Beausoliel, Jr., Robert W.
• Assistant Examiner(s): Baderman, Scott T.
• Application Number:
  US08/306,906
• Time in Patent Office: 1,881 Days
• Field of Search: 437/8, 437/51, 371/15.1, 371/22.1, 324/605, 324/606, 714/25
• US Class Current: 714/25
• CPC Class Codes: G01R 31/01 Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station testing of cables continuously passing the testing apparatus G01R31/59; testing dielectric strength or breakdown voltage G01R31/12
• CPC Class Codes: G01R 31/2822 of microwave or radiofrequency circuits of attenuation, gain, e.g. using network analyzers G01R27/28
• CPC Class Codes: G01R 31/3025 Wireless interface with the DUT
• CPC Class Codes: G01R 31/303 of integrated circuits G01R31/305 - G01R31/315 take precedence
• CPC Class Codes: G06K 19/0701 at least one of the integrated circuit chips comprising an arrangement for power management
• CPC Class Codes: G06K 7/0095 Testing the sensing arrangement, e.g. testing if a magnetic card reader, bar code reader, RFID interrogator or smart card reader functions properly testing of electrical circuits G01R31/28

Abstract

A plurality of battery-operated transceivers encapsulated by lamination to form a sheet of independent transceivers is tested in a two piece fixture that forms an enclosure surrounding each in-sheet transceiver. Each enclosure has an antenna for transmitting a command signal to the transceiver at a known power level and for receiving a reply message from the transceiver containing a power level measurement made by the transceiver. Test methods using the fixture of the present invention are also described.

Claims

1. A method for a test fixture system to test the sensitivity of an RF transponder, comprising the steps of:

a) a test fixture system transmitting a first RF signal to an RF transponder;

b) the transponder receiving the first RF signal and detecting the value of the strength of the received signal;

c) the transponder producing a multiple-bit digital representation of the detected signal strength value; and

d) the transponder transmitting a second RF signal containing a message conveying the multiple-bit digital representation of the value of the received signal strength measurement.

2. A method according to claim 1, further comprising the steps of:

a) the test fixture system receiving the second RF signal; and

b) the test fixture system identifying the transponder as defective depending on the value conveyed in the message contained in the second RF signal.

3. A system for testing the RF sensitivity of an RF transponder, comprising:

an RF test fixture that transmits a first RF signal; and

an RF transponder including

a) an antenna for receiving the first RF signal,

b) a signal strength measurement circuit, connected to the antenna, for producing a multiple-bit digital representation of the strength of the received RF signal, and

c) a transmitter circuit for transmitting a second RF signal containing a message conveying the multiple-bit digital representation of the received signal strength.

4. A system according to claim 3, wherein the signal strength measurement circuit comprises:

a) a detector for detecting the signal strength of the received RF signal and for producing an analog output signal proportional to the signal strength; and

b) an analog-to-digital converter having an analog input and a multiple-bit digital output, the analog input being connected to receive the detector output signal, wherein the converter produces at its output a multiple-bit digital representation of the value of the detector output.

5. A system according to claim 3, wherein the RF test fixture further comprises:

a receiver circuit for receiving the second RF signal; and

a circuit for identifying the transponder as defective depending on the value conveyed in the message contained in the second RF signal.