Weighted random pattern built-in self-test
First Claim
1. An integrated circuit, comprising logic circuits connected to a scan chain and self-test circuits for testing said logic circuits, said self-test circuits comprising:
- a pseudo random pattern generator for generating at least one pseudo random pattern;
a weighting circuit for providing a weight to said pseudo random pattern; and
a selection circuit for providing said weighted pseudo random pattern to said scan chain for scanning said weighted pattern to said logic circuits.
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Accused Products
Abstract
An integrated circuit comprising logic circuits and self-test circuits for testing logic circuits including a pseudo random pattern generator for generating at least one pseudo random pattern and weighing circuit for weighing the pseudo random pattern. The weighting circuit and pseudo random pattern generator generate a plurality of weighted pseudo random patterns including at least one pair of a first weighted pseudo random pattern and a second weighted pseudo random pattern that is the complement of the first pattern. A weighting instruction selects one of the first or second pseudo random patterns for testing the logic circuits.
141 Citations
20 Claims
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1. An integrated circuit, comprising logic circuits connected to a scan chain and self-test circuits for testing said logic circuits, said self-test circuits comprising:
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a pseudo random pattern generator for generating at least one pseudo random pattern; a weighting circuit for providing a weight to said pseudo random pattern; and a selection circuit for providing said weighted pseudo random pattern to said scan chain for scanning said weighted pattern to said logic circuits. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. A method of testing an integrated circuit, comprising logic circuits connected to a scan chain and self-test circuits for testing said logic circuits, the method comprising:
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a) generating a pseudo random pattern; b) providing a weight to said pseudo random pattern; and c) providing said weighted pseudo random pattern to the scan chain for scanning said weighted pattern to the logic circuits. - View Dependent Claims (13, 14, 15, 16, 17, 18, 19, 20)
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Specification