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Use of redundant circuits to improve the reliability of an integrated circuit

  • US 5,986,950 A
  • Filed: 10/15/1997
  • Issued: 11/16/1999
  • Est. Priority Date: 10/15/1997
  • Status: Expired due to Fees
First Claim
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1. A method for improving yield and reliability in a manufactured integrated circuit incorporating redundant circuits, comprising the steps of:

  • testing the integrated circuit for defects to identify defective portions of the integrated circuit, wherein the defective portions define a pattern;

    analyzing the pattern of the defective portions of the integrated circuit by comparing the pattern of the defective portions with a predetermined pattern of an integrated circuit including a latent defect for causing a subsequent failure of the integrated circuit, and identifying non-defective portions of the integrated circuit corresponding to the predetermined pattern of the integrated circuit including the latent defect;

    replacing the defective portions of the integrated circuit with the redundant circuits; and

    replacing the non-defective portions of the integrated circuit corresponding to the predetermined pattern with additional redundant circuits.

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