Methods of making high voltage GaN-AlN based semiconductor devices and semiconductor devices made
First Claim
1. In a semiconductor device, the structure comprising a substrate, a layer of GaN of one conductivity type on said substrate, a semi-insulating portion of AlN on said layer of one conductivity type GaN, and GaN of an opposite conductivity type on said GaN of one conductivity type at opposite sides of said insulating portion of AlN and disposed partially under said portion of AlN.
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Abstract
The present invention is directed to a technique for manufacturing semiconductor devices in which p type GaN is formed on a substrate and semi-insulating AlN is formed on the P type GaN with n type GaN formed on the p type GaN and partially below the AlN. Highly efficient high power and high voltage semiconductor devices are formed through this technique having better or similar properties to silicon type semiconductors.
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Citations
2 Claims
- 1. In a semiconductor device, the structure comprising a substrate, a layer of GaN of one conductivity type on said substrate, a semi-insulating portion of AlN on said layer of one conductivity type GaN, and GaN of an opposite conductivity type on said GaN of one conductivity type at opposite sides of said insulating portion of AlN and disposed partially under said portion of AlN.
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