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Detecting groups of defects in semiconductor feature space

  • US 5,991,699 A
  • Filed: 04/02/1997
  • Issued: 11/23/1999
  • Est. Priority Date: 05/04/1995
  • Status: Expired due to Term
First Claim
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1. A computer program stored on a computer-readable medium for analyzing data associated with defects on a substrate detected during production of semiconductor wafers, wherein for a region of interest on said substrate said data includes a quantitative number and density of defects and other characteristics of each of said defects, said computer program comprising:

  • instructions for calculating a minimum number of defects in said region to be included in a cluster of defects using said quantitative number of defects in said region of interest;

    instructions for calculating a first maximum threshold of a first of said characteristics of said defects included in said defect data in said region to be included in a cluster of defects using said defect density in said region of interest; and

    instructions for generating a cluster of defects having at least said calculated minimum number of defects and each included defect having said first of said characteristics that does not exceed said first maximum threshold.

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