Frequency domain reflectometer and method of suppressing harmonics

• US 5,994,905 A
• Filed: 12/02/1997
• Issued: 11/30/1999
• Est. Priority Date: 12/02/1997
• Status: Expired due to Term

• Current Assignee: Wavetek Corp. (Lumentum Holdings Inc.)
• Original Assignee: Wavetek Corp. (Lumentum Holdings Inc.)
• Inventors: Franchville, Douglas J.
• Primary Examiner(s): Do, Diep N.
• Application Number:
  US08/982,596
• Time in Patent Office: 728 Days
• Field of Search: 324/527, 324/528, 324/533, 324/534, 324/539, 324/642, 324/645, 324/646, 324/647, 324/607
• US Class Current: 324/533
• CPC Class Codes: G01R 19/0053 Noise discrimination; Analog sampling; Measuring transients measuring characteristics of individual pulses G01R29/02; digital sampling G01R19/2509; measuring noise figure G01R29/26
• CPC Class Codes: G01R 31/11 using pulse reflection methods

Abstract

Frequency domain reflectometer and method of locating faults in a transmission line utilized by the reflectometer are disclosed. The reflectometer suppresses harmonics that may be interpreted as faults that in actuality do not exist. In general, the reflectometer applies a sweep signal to the transmission line in order to obtain a reflected sweep response signal. Then, the reflectometer obtains a sweep response spectrum from the reflected sweep response signal. The reflected sweep response signal includes a plurality of spectral peaks which represent the frequency components of the reflected sweep response signal. Then, the reflectometer mathematically determines which spectral peaks of the reflected sweep response spectrum were generated due to harmonics in the reflected sweep response signal. After determining that a spectral peak is a harmonic of a fundamental spectral peak, the reflectometer subtracts a percentage of the fundamental spectral peak from the harmonic spectral peak, thereby suppressing a harmonic of the reflected sweep response signal. The reflectometer then obtains from the adjusted sweep response spectrum a location of an impedance mismatch in the transmission line.

Claims

1. A method of locating impedance mismatches in a system under test, comprising the steps of:

applying a test sweep signal to said system under test in order to obtain a reflected sweep response signal from said system under test, said reflected sweep response signal representative of a frequency response of said system under test;

generating from said reflected sweep response signal a reflected sweep response spectrum that includes a plurality of spectral peaks;

determining that a first frequency of a first spectral peak of said plurality of spectral peaks is a harmonic of a second frequency of a second spectral peak of said plurality of spectral peaks;

subtracting from a first magnitude of said first spectral peak a first predetermined percentage of a second magnitude of said second spectral peak in order to obtain an adjusted sweep response spectrum; and

obtaining from said adjusted sweep response spectrum a location of an impedance mismatch in said system under test.

2. The method of claim 1, wherein said determining step includes the step of:

determining that said first frequency of said first spectral peak is substantially equal to an integer multiple of said second frequency of said second spectral peak.

3. The method of claim 1, wherein said first spectral peak corresponds to a first distance and said second spectral peak corresponds to a second distance and said determining step includes the step of:

determining that said first distance of said first spectral peaks is substantially equal to an integer multiple of said second distance of said second spectral peak.

4. The method of claim 1, wherein said determining step includes the step of:

determining that said second magnitude of said second spectral peak is greater than a noise floor level.

5. The method of claim 1, wherein said determining step includes the step of:

determining that said second magnitude of said second spectral peak is greater than magnitudes of spectral peaks within a first harmonic window, said first harmonic window defining a set of spectral peaks having frequencies of which said first frequency of said first spectral peak may be a first harmonic.

6. The method of claim 1, wherein said determining step includes the step of:

determining that said second magnitude of said second spectral peak is greater than magnitudes of spectral peaks within a first harmonic window, said first harmonic window defining a first set of spectral peaks having frequencies of which said first frequency of said first spectral peak may be a first harmonic,

obtaining a third spectral peak from a second harmonic window, said second harmonic window defining a second set of spectral peaks having frequencies of which said first frequency of said first spectral peak may be a second harmonic, and

determining that said first predetermined percentage of said second magnitude is greater than a second predetermined percentage of a third magnitude of said third spectral peak.

7. The method of claim 1, wherein said determining step includes the step of:

determining that said second magnitude of said second spectral peak is greater than magnitudes of spectral peaks within a second harmonic window, said second harmonic window defining a set of spectral peaks having frequencies of which said first frequency of said first spectral peak may be a second harmonic.

8. The method of claim 1, wherein said determining step includes the step of:

obtaining a third spectral peak from a first harmonic window, said first harmonic window defining a first set of spectral peaks having frequencies of which said first frequency of said first spectral peak may be a first harmonic,

determining that said second magnitude of said second spectral peak is greater than magnitudes of spectral peaks within a second harmonic window, said second harmonic window defining a second set of spectral peaks having frequencies of which said first frequency of said first spectral peak may be a second harmonic, and

determining that said first predetermined percentage of said second magnitude is greater than a second predetermined percentage of a third magnitude of said third spectral peak.

9. A method of suppressing harmonics in a signal, comprising the steps of:

generating a signal spectrum that includes a plurality of spectral peaks that are representative of said signal;

determining that a first frequency of a first spectral peak of said plurality of spectral peaks is a harmonic of a second frequency of a second spectral peak of said plurality of spectral peaks; and

subtracting from a first magnitude of said first spectral peak a first predetermined percentage of a second magnitude of said second spectral peak in order to obtain an adjusted signal spectrum.

10. The method of claim 9, further comprising the step of:

generating from said adjusted signal spectrum a harmonic suppressed signal that is representative of said signal with at least one suppressed harmonic.

11. The method of claim 9, wherein said determining step includes the step of:

determining that said first frequency of said first spectral peak is substantially equal to an integer multiple of said second frequency of said second spectral peak.

12. The method of claim 9, wherein said first spectral peak corresponds to a first distance and said second spectral peak corresponds to a second distance and said determining step includes the step of:

determining that said first distance of said first spectral peaks is substantially equal to an integer multiple of said second distance of said second spectral peak.

13. The method of claim 9, wherein said determining step includes the step of:

determining that said second magnitude of said second spectral peak is greater than a noise floor level.

14. The method of claim 9, wherein said determining step includes the step of:

determining that said second magnitude of said second spectral peak is greater than magnitudes of spectral peaks within a first harmonic window, said first harmonic window defining a set of spectral peaks having frequencies of which said first frequency of said first spectral peak may be a first harmonic.

15. The method of claim 9, wherein said determining step includes the step of:

determining that said second magnitude of said second spectral peak is greater than magnitudes of spectral peaks within a first harmonic window, said first harmonic window defining a first set of spectral peaks having frequencies of which said first frequency of said first spectral peak may be a first harmonic,

obtaining a third spectral peak from a second harmonic window, said second harmonic window defining a second set of spectral peaks having frequencies of which said first frequency of said first spectral peak may be a second harmonic, and

determining that said first predetermined percentage of said second magnitude is greater than a second predetermined percentage of a third magnitude of said third spectral peak.

16. The method of claim 9, wherein said determining step includes the step of:

determining that said second magnitude of said second spectral peak is greater than magnitudes of spectral peaks within a second harmonic window, said second harmonic window defining a set of spectral peaks having frequencies of which said first frequency of said first spectral peak may be a second harmonic.

17. The method of claim 9, wherein said determining step includes the step of:

obtaining a third spectral peak from a first harmonic window, said first harmonic window defining a first set of spectral peaks having frequencies of which said first frequency of said first spectral peak may be a first harmonic,

determining that said second magnitude of said second spectral peak is greater than magnitudes of spectral peaks within a second harmonic window, said second harmonic window defining a second set of spectral peaks having frequencies of which said first frequency of said first spectral peak may be a second harmonic, and

determining that said first predetermined percentage of said second magnitude is greater than a second predetermined percentage of a third magnitude of said third spectral peak.

18. A reflectometer for locating impedance mismatches in a system under test, comprising:

a connector for coupling to said system under test;

a transmitter circuit coupled to said connector and configured to apply a test sweep signal to said connector and said system under test coupled thereto;

a receiver circuit coupled to said connector and configured to obtain from a resultant response signal that is a representative of a frequency response of said system under test, said resultant response signal including (i) said test sweep signal from said transmitter circuit and (ii) a reflected sweep response signal received from said system under test coupled to said connector;

a spectral analyzer coupled to said receiver circuit, said spectral analyzer configured to generate from said reflected sweep response signal a reflected sweep response spectrum that includes a plurality of spectral peaks;

a harmonic suppression circuit coupled to said spectral analyzer, said harmonic suppression circuit configured to (i) determine that a first frequency of a first spectral peak of said plurality of spectral peaks is a harmonic of a second frequency of a second spectral peak of said plurality of spectral peaks, and (ii) obtain an adjusted response spectrum by subtracting from a first magnitude of said first spectral peak a first predetermined percentage of a second magnitude of said second spectral peak; and

a fault locator coupled to said harmonic suppression circuit and configured to determine from said adjusted response spectrum a location of an impedance mismatch in said system under test.

19. The reflectometer of claim 18, wherein:

said harmonic suppression circuit is further configured to determine that said first frequency of said first spectral peak is substantially equal to an integer multiple of said second frequency of said second spectral peak.

20. The reflectometer of claim 18, wherein:

said first spectral peak corresponds to a first distance and said second spectral peak corresponds to a second distance, and

said harmonic suppression circuit is further configured to determine that said first distance of said first spectral peaks is substantially equal to an integer multiple of said second distance of said second spectral peak.

21. The reflectometer of claim 18, wherein:

said harmonic suppression circuit is further configured to determine that said second magnitude of said second spectral peak is greater than a noise floor level.

22. The reflectometer of claim 18, wherein:

said harmonic suppression circuit is further configured to determine that said second magnitude of said second spectral peak is greater than magnitudes of spectral peaks within a first harmonic window, said first harmonic window defining a set of spectral peaks having frequencies of which said first frequency of said first spectral peak may be a first harmonic.

23. The reflectometer of claim 18, wherein:

said harmonic suppression circuit is further configured to (i) determine that said second magnitude of said second spectral peak is greater than magnitudes of spectral peaks within a first harmonic window, said first harmonic window defining a first set of spectral peaks having frequencies of which said first frequency of said first spectral peak may be a first harmonic, (ii) obtain a third spectral peak from a second harmonic window, said second harmonic window defining a second set of spectral peaks having frequencies of which said first frequency of said first spectral peak may be a second harmonic, and (iii) determine that said first predetermined percentage of said second magnitude is greater than a second predetermined percentage of a third magnitude of said third spectral peak.

24. The reflectometer of claim 18, wherein:

said harmonic suppression circuit is further configured to determine that said second magnitude of said second spectral peak is greater than magnitudes of spectral peaks within a second harmonic window, said second harmonic window defining a set of spectral peaks having frequencies of which said first frequency of said first spectral peak may be a second harmonic.

25. The reflectometer of claim 18, wherein:

said harmonic suppression circuit is further configured to (i) obtain a third spectral peak from a first harmonic window, said first harmonic window defining a first set of spectral peaks having frequencies of which said first frequency of said first spectral peak may be a first harmonic, (ii) determine that said second magnitude of said second spectral peak is greater than magnitudes of spectral peaks within a second harmonic window, said second harmonic window defining a second set of spectral peaks having frequencies of which said first frequency of said first spectral peak may be a second harmonic, and (iii) determine that said first predetermined percentage of said second magnitude is greater than a second predetermined percentage of a third magnitude of said third spectral peak.

26. A reflectometer for locating impedance mismatches in a system under test, comprising:

a connector for coupling to said system under test;

a transmitter circuit coupled to said connector and configured to apply a test sweep signal to said connector and said system under test coupled thereto;

a measurement circuit coupled to said connector and configured to generate a plurality of measurement signals indicative of a resultant response signal that includes (i) said test sweep signal from said transmitter circuit and (ii) a reflected sweep response signal received from said system under test and representative of a frequency response of said system under test;

an analog to digital (A/D) converter coupled to said measurement circuit and configured to generate from said plurality of measurement signals a digitized resultant response signal that is a digital representation of said resultant response signal;

a digital signal processing (DSP) circuit coupled to said AID converter, said DSP circuit configured to (i) obtain said reflected sweep response signal from said digitized resultant response signal, (ii) generate from said reflected sweep response signal a reflected sweep response spectrum that includes a plurality of spectral peaks;

(iii) determine that a first frequency of a first spectral peak of said plurality of spectral peaks is a harmonic of a second frequency of a second spectral peak of said plurality of spectral peaks, (iv) obtain an adjusted response spectrum by subtracting from a first magnitude of said first spectral peak a first predetermined percentage of a second magnitude of said second spectral peak; and

(v) determine from said adjusted response spectrum a location of an impedance mismatch in said system under test.

27. The reflectometer of claim 26, wherein:

said DSP circuit is further configured to determine that said first frequency of said first spectral peak is substantially equal to an integer multiple of said second frequency of said second spectral peak.

28. The reflectometer of claim 26, wherein:

said first spectral peak corresponds to a first distance and said second spectral peak corresponds to a second distance, and

said DSP circuit is further configured to determine that said first distance of said first spectral peaks is substantially equal to an integer multiple of said second distance of said second spectral peak.

29. The reflectometer of claim 26, wherein:

said DSP circuit is further configured to determine that said second magnitude of said spectral peak is greater than a noise floor level.

30. The reflectometer of claim 26, wherein:

said DSP circuit is further configured to determine that said second magnitude of said second spectral peak is greater than magnitudes of spectral peaks within a first harmonic window, said first harmonic window defining a set of spectral peaks having frequencies of which said first frequency of said first spectral peak may be a first harmonic.

31. The reflectometer of claim 26, wherein:

said DSP circuit is further configured to (i) determine that said second magnitude of said second spectral peak is greater than magnitudes of spectral peaks within a first harmonic window, said first harmonic window defining a first set of spectral peaks having frequencies of which said first frequency of said first spectral peak may be a first harmonic, (ii) obtain a third spectral peak from a second harmonic window, said second harmonic window defining a second set of spectral peaks having frequencies of which said first frequency of said first spectral peak may be a second harmonic, and (iii) determine that said first predetermined percentage of said second magnitude is greater than a second predetermined percentage of a third magnitude of said third spectral peak.

32. The reflectometer of claim 26, wherein:

said DSP circuit is further configured to determine that said second magnitude of said second spectral peak is greater than magnitudes of spectral peaks within a second harmonic window, said second harmonic window defining a set of spectral peaks having frequencies of which said first frequency of said first spectral peak may be a second harmonic.

33. The reflectometer of claim 26, wherein:

said DSP circuit is further configured to (i) obtain a third spectral peak from a first harmonic window, said first harmonic window defining a first set of spectral peaks having frequencies of which said first frequency of said first spectral peak may be a first harmonic, (ii) determine that said second magnitude of said second spectral peak is greater than magnitudes of spectral peaks within a second harmonic window, said second harmonic window defining a second set of spectral peaks having frequencies of which said first frequency of said first spectral peak may be a second harmonic, and (iii) determine that said first predetermined percentage of said second magnitude is greater than a second predetermined percentage of a third magnitude of said third spectral peak.