Ferroelectric memory using ferroelectric reference cells

• US 5,999,439 A
• Filed: 03/01/1999
• Issued: 12/07/1999
• Est. Priority Date: 09/11/1995
• Status: Expired due to Term

• Current Assignee: Micron Technology, Inc.
• Original Assignee: Micron Technology, Inc.
• Inventors: Seyyedy, Mirmajid
• Primary Examiner(s): Fears, Terrell W.
• Application Number:
  US09/259,761
• Time in Patent Office: 281 Days
• Field of Search: 365/45, 365/189.01, 365/230.01
• US Class Current: 365/145
• CPC Class Codes: G11C 11/22 using ferroelectric elements

Abstract

A random access memory circuit is described which uses single ferroelectric memory cells to store data. The ferroelectric memory cells can be selectively read using reference cells to generate a reference voltage which is compared to a voltage representative of data stored on the memory cell using a multiplexed sense amplifier. In using two ferroelectric reference cells in which one contains a logical 0 polarization, and the other contains a logical 1 polarization, a single-ended reference voltage can be generated on a reference bit line. A ferroelectric memory cell can then be read by comparing the voltage on its corresponding bit line to the reference bit line using the sense amplifier. The content of the memory cell being read and the content of the reference cells can be rewritten on the same clock cycles to save on access time.

Claims

1. An integrated memory circuit comprising:

an array of ferroelectric memory cells;

a multiplexed sense amplifier coupled to the array for sensing and amplifying data stored on the ferroelectric memory cells;

a first and a second reference circuit coupled to the array for providing a reference voltage that is compared to a voltage representative of data stored on the ferroelectric memory cells using the multiplexed sense amplifier; and

an alternate reference voltage circuit coupled to the first reference circuit for providing a reference voltage which is substantially stable over time, wherein the alternate reference voltage circuit includes a non-remnant capacitor circuit coupled to a voltage regulator.

2. The integrated memory circuit of claim 1 wherein the multiplexed sense amplifier uses a single ended reference voltage from either the first reference circuit, the second reference circuit, or the alternate reference voltage circuit.

3. An integrated memory circuit comprising:

an array of ferroelectric memory cells;

a multiplexed sense amplifier coupled to the array for sensing and amplifying data stored on the ferroelectric memory cells;

a first and a second reference circuit coupled to the array for providing a reference voltage that is compared to a voltage representative of data stored on the ferroelectric memory cells using the multiplexed sense amplifier; and

an alternate reference voltage circuit coupled to the first reference circuit providing a reference voltage which is substantially stable over time, wherein the reference voltage circuit includes a non-remnant capacitor circuit which is coupled to a voltage regulator and which comprises;

a conductor line having a line capacitance; and

one or more capacitors selectively coupled to the conductor line via access devices.

4. The integrated memory circuit of claim 3 wherein a capacitance of the non-remnant capacitor circuit is substantially lower than a bit line capacitance.

5. The integrated memory circuit of claim 3 wherein the array is arranged in addressable rows and columns and a ferroelectric memory cell is located at the intersection of each row and column, and each ferroelectric memory cell comprises a single ferroelectric capacitor.

6. The integrated memory circuit of claim 3 wherein the array of ferroelectric memory cells utilizes a folded bit line architecture in which bit lines for adjacent columns have staggered cells such that a word line from a row does not activate ferroelectric memory cells on adjacent bit lines.

7. The integrated memory circuit of claim 3 wherein the multiplexed sense amplifier uses a single ended reference voltage from either the first reference circuit, the second reference circuit, or the alternate reference voltage circuit.

8. An integrated memory circuit comprising:

an array of one or more ferroelectric memory cells;

multiplexed sense amplifier means for comparing signals representative of data stored on at least one of the ferroelectric memory cells to a reference voltage and providing an output voltage representative of the stored data;

first and second reference means for providing the reference voltage to the sense amplifier means; and

alternate reference voltage means coupled to the first reference circuit for providing a reference voltage which is substantially stable over time.

9. An integrated memory circuit comprising:

an array of ferroelectric memory cells;

a first and a second reference circuit coupled to the array for providing a reference voltage, wherein the first and second reference circuits each comprise one or more ferroelectric reference cells;

an alternate reference voltage circuit coupled to the first reference circuit for providing a reference voltage which is substantially stable over time, wherein the reference voltage circuit includes a non-remnant capacitor circuit coupled to a voltage regulator; and

a multiplexed sense amplifier coupled to the array and to the first, second, and alternate reference voltage circuits for comparing signals representing data stored on the ferroelectric memory cells to the reference voltage of either the first reference circuit, the second reference circuit, or the alternate reference voltage circuit.

10. An integrated memory circuit comprising:

an array of ferroelectric memory cells;

a first and a second reference circuit coupled to the array for providing a reference voltage, wherein the first and second reference circuits each comprise an even number of ferroelectric reference cells, with a first one-half of the ferroelectric reference cells polarized in one logical state and a second one-half of the ferroelectric reference cells polarized in an opposite logical state; and

an alternate reference voltage circuit coupled to the first reference circuit for providing a reference voltage which is substantially stable over time, wherein the reference voltage circuit includes a non-remnant capacitor circuit coupled to a voltage regulator; and

a multiplexed sense amplifier coupled to the array and to the first, second, and alternate reference voltage circuits for comparing signals representing data stored on the ferroelectric memory cells to the reference voltage of either the first reference circuit, the second reference circuit, or the alternate reference voltage circuit.

11. The integrated memory circuit of claim 10 wherein the content of a ferroelectric memory cell being read and the ferroelectric reference cells can be rewritten on a same clock cycle.

12. The computer system of claim 10 wherein the array of ferroelectric memory cells comprises a folded bit line architecture in which bit lines for adjacent columns have staggered cells such that a word line from a row does not activate ferroelectric memory cells on adjacent bit lines.

13. An integrated memory circuit comprising:

an array of ferroelectric memory cells;

a first and a second reference circuit coupled to the array for providing a reference voltage, wherein each reference circuit comprises an even number of ferroelectric reference cells, with a first one-half of the ferroelectric reference cells polarized in one logical state and a second one-half of the ferroelectric reference cells polarized in an opposite logical state;

an alternate reference voltage circuit coupled to the first reference circuit for providing a reference voltage which is substantially stable over time, wherein the reference voltage circuit includes a non-remnant capacitor circuit coupled to a voltage regulator; and

a multiplexed sense amplifier coupled to the array and to the first, second, alternate reference voltage circuits for comparing signals representing data stored on the ferroelectric memory cells to the reference voltage of either the first reference circuit, the second reference circuit, or the alternate reference voltage circuit.

14. A computer system comprising:

a processor; and

a memory device coupled to the processor, wherein the processor defines memory access cycles, the memory device comprising;

an array of one or more ferroelectric memory cells;

multiplexed sense amplifier means for comparing signals representative of data stored on at least one of the ferroelectric memory cells to a reference voltage and providing an output voltage representative of the stored data;

first and second reference means for providing the reference voltage to the sense amplifier means; and

alternate reference voltage means coupled to the first reference circuit for providing a reference voltage which is substantially stable over time.

15. The computer system of claim 14 wherein the array of ferroelectric memory cells utilizes a folded bit line architecture in which bit lines for adjacent columns have staggered cells such that a word line from a row does not activate ferroelectric memory cells on adjacent bit lines.

16. A computer system comprising:

a processor; and

a memory device coupled to the processor, wherein the processor defines memory access cycles, the memory device comprising;

an array of ferroelectric memory cells arranged according to a folded bit line architecture including two or more columns with staggered cells;

a multiplexed sense amplifier coupled to the array for sensing and amplifying data stored on the ferroelectric memory cells;

a first and a second reference circuit coupled to the array for providing a reference voltage that is compared to a voltage representative of data stored on the ferroelectric memory cells using the multiplexed sense amplifier, wherein the first and second reference circuits each comprise an even number of ferroelectric reference cells, with a first half of the ferroelectric reference cells polarized in one logical state and a second half of the ferroelectric reference cells polarized in an opposite logical state; and

an alternate reference voltage circuit coupled to the first reference circuit providing a reference voltage which is substantially stable over time, wherein the reference voltage circuit includes a non-remnant capacitor circuit coupled to a voltage regulator.